Support

Support Options

Submit a Support Ticket

 

XPS Thickness Solver

By Kyle Christopher Smith1, David A Saenz1, Dmitry Zemlyanov1, Andrey A Voevodin2

1. Purdue University 2. Air Force Research Laboratory

Helps the user to determine the thickness of an overlayer material from XPS experiment data.

Launch Tool

You must login before you can run this tool.

Version 3.0 - published on 04 Jun 2012

doi:10.4231/D3N29P603 cite this

This tool is closed source.

View All Supporting Documents

See also

No results found.

Versions

Version Released DOI Handle Published
3.0 04 Jun 2012 doi:10.4231/D3N29P603 yes
beta 2.0 10 Jan 2012 doi:10.4231/D35D8ND60 no

No classroom usage data was found. You may need to enable JavaScript to view this data.

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.