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3 min Research Talk: AFM And EBSD Cross-Comparison Analysis Tool
31 Jan 2019 | | Contributor(s):: Andrew Martin Krawec
This talk describes an approach to analyzing the crystal structure using data collected from AFM and EBSD scans to build an accurate image of the crystal structure and orientation in the ceramic
AFM And EBSD Cross-Comparison Analysis Tool
14 Aug 2018 | | Contributor(s):: Andrew Martin Krawec, John Blendell, Matthew John Michie
Ceramic and semiconductor research is limited in its ability to create holistic representations of data in concise, easily-accessible file formats or visual data representations. These materials are used in everyday electronics, and optimizing their electrical and physical properties is...
Learning Module: Microcantilevers - Instructor Materials
09 Feb 2017 | | Contributor(s):: Southwest Center for Microsystems Education (SCME)
This learning module is an overview of microcantilevers, how they work and how they are used in micro and nanotechnology. These are the instructor materials.
Learning Module: Microcantilevers
This learning module introduces you to the microcantilever, its applications in micro and nanotechnologies, its use in sensor arrays, and how it works in both static and dynamic modes of operation. There is a pre and post-test, four (4) informational units (PKs), and two (2)...
High Accuracy Atomic Force Microscope with Self-Optimizing Scan Control
19 Sep 2016 | | Contributor(s):: Ryan (Young-kook) Yoo
Atomic force microscope (AFM) is a very useful instrument in characterizing nanoscale features, However, the original AFM design, based on piezo-tube scanner, had slow response and non-orthogonal behavior, inadequate to address the metrology needs of industrial applications: accuracy,...
Jhon Pazos Alonso
[Illinois] AFM indentation tests reveal the poroelastic nature of the cytoplasm
19 Nov 2015 | | Contributor(s):: Emad Moeendarbary
Apr 01 2015
Workshop on Nanoindentation and Its Applications in Mechanotransduction and Characterization of Soft Materials
MATLAB-based blind tip reconstruction algorithms
01 Aug 2014 | | Contributor(s):: Erin Flater, Charles Clifford
We are making available for download our MATLAB-based blind tip reconstruction algorithms. These algorithms are based on the code published in J. Villarrubia, "Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation", Journal of Research...
Near-field radiative heat transfer and Casimir Force Measurement
30 May 2012 | | Contributor(s):: Joel Chevrier
This presentation first makes a simple introduction on how the charge fluctuations give rises to these effects that are nowadays most effectively detected using MEMS or AFM technologies. This will lead to question the relevance of these effects in the use of MEMS. After description of our...
Nanoscale Spectroscopy and Plasmonics in Infrared
19 Apr 2012 | | Contributor(s):: Mikhail Belkin
In this talk, I will present the results of two of our research projects. I will start with a simple technique for nanoscale mid-infrared spectroscopy that we have developed recently. Subwavelength resolution is achieved by detecting optical absorption through measuring local photothermal...
Tejasvi Parupudi S V R V
BNC Annual Research Review: Recent advances in dynamic Atomic Force Microscopy Research at Birck
02 Dec 2009 | | Contributor(s):: Arvind Raman