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  1. [Illinois] Advanced Materials Characterization Workshop 2012: Recent Developments in a Novel Dynamical Testing Technique

    05 Jul 2012 | Online Presentations | Contributor(s): Jeffrey Schirer

    Nanomechanical testing, often nanoindentation, has been well-established at a basic level for characterization of small volumes of material and low-dimensional structures, with the size scale of...

    http://nanohub.org/resources/14475

  2. [Illinois] Advanced Materials Characterization Workshop 2012: Technical Requirements For Successful Tip Enhanced Raman (TERS) Imaging: Towards Label-Free Chemical Imaging At The Nano-scale

    05 Jul 2012 | Online Presentations | Contributor(s): Emmanuel Leroy

    Since the mid 1980’s, Scanning Probe Microscopy has been a catalyst for research on nanotechnologies, making the study of nano-materials affordable, and has greatly enhanced the analysis of...

    http://nanohub.org/resources/14473

  3. [Illinois] Advanced Materials Characterization Workshop 2012: AM-FM and Loss Tangent Imaging, Two Tools for Quant. Nanomechanical Property Mapping

    05 Jul 2012 | Online Presentations | Contributor(s): Irene Revenko

    Amplitude-modulated Atomic Force Microscopy (AM-AFM), also known as tapping mode, is a proven, reliable and gentle imaging method with wide spread applications. Previously, the contrast in AM-AFM...

    http://nanohub.org/resources/14472

  4. [Illinois] Advanced Materials Characterization Workshop 2012: Advanced AFM-Raman Setup - Towards The Spatial and Spectroscopic Resolution At Single Molecule Level

    05 Jul 2012 | Online Presentations | Contributor(s): Alexey Temiryazev

    Significant advances in Scanning Probe Microscopy (SPM) during the last decade have allowed true molecular resolution in vacuum, liquid and ambient conditions. The next step in the development of...

    http://nanohub.org/resources/14471

  5. [Illinois] Advanced Materials Characterization Workshop 2012: Tutorial 3: X-ray Electron Spectroscopy / Auger Electron Spectroscopy

    05 Jul 2012 | Online Presentations | Contributor(s): Rick Haasch

    This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will...

    http://nanohub.org/resources/14470

  6. [Illinois] Advanced Materials Characterization Workshop 2012: Tutorial 4: X-ray Diffraction and Reflectometry

    05 Jul 2012 | Online Presentations | Contributor(s): Mauro Sardela

    This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will...

    http://nanohub.org/resources/14469

  7. [Illinois] Advanced Materials Characterization Workshop 2012: The Schmidt-Czerny-Turner Spectrograph

    05 Jul 2012 | Online Presentations | Contributor(s): Jason McClure

    The Czerny-Turner type imaging spectrograph is by far the most commonly used research instrument in dispersive optical spectroscopy. Image aberrations inherent in this type spectrograph impart...

    http://nanohub.org/resources/14468

  8. [Illinois] Advanced Materials Characterization Workshop 2012: Tutorial 5: Secondary Ion Mass Spectrometry/Rutherford Backscattering

    05 Jul 2012 | Online Presentations | Contributor(s): Timothy P. Spila

    Secondary ion mass spectrometry is an analytical technique based on the measurement of themass of ions ejected from a solid surface after the surface has been bombarded with high energy (1-25 keV)...

    http://nanohub.org/resources/14467

  9. [Illinois] Advanced Materials Characterization Workshop 2012: Nanofabrication of Plasmonic Devices in the Helium Ion Microscope

    05 Jul 2012 | Online Presentations | Contributor(s): Larry Scipioni

    Helium ion microscopy (HIM) is being used both to create and to inspect nanostructures for photonic and plasmonic devices. As part of a program exploring photoelectrons as sources for multiple...

    http://nanohub.org/resources/14464

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