Tags: Amplitude Modulation AFM

Online Presentations (1-14 of 14)

  1. ME 597 Lecture 16: Dynamic Approach Curves in AM-AFM (VEDA Demo)

    24 Jan 2011 | | Contributor(s):: John Melcher

    Guest lecturer: John Melcher. VEDA demonstration.

  2. ME 597 Lecture 20: Scanning Controls (VEDA Demo)

    13 Jan 2011 | | Contributor(s):: Daniel Kiracofe

    Guest lecturer: Daniel Kiracofe. VEDA demonstration.

  3. ME 597 Lecture 17: Cantilever Eigenmodes, Equivalent Point Mass Oscillator, Analytical Approaches

    29 Dec 2010 | | Contributor(s):: Arvind Raman

  4. ME 597 Lecture 25: AFM in Liquids I

    20 Dec 2010 | | Contributor(s):: Arvind Raman

  5. ME 597 Lecture 26: AFM in Liquids II

    20 Dec 2010 | | Contributor(s):: Arvind Raman

  6. ME 597 Lecture 24: Using AFM to Measure Electrostatic Forces

    07 Dec 2010 | | Contributor(s):: Ron Reifenberger

  7. ME 597 Lecture 18b: Analytical Approaches - Peak Interaction Forces

    17 Nov 2010 | | Contributor(s):: Arvind Raman

    Peak Force During Tapping - not directly observable.

  8. ME 597 Lecture 18a: Analytical Approaches

    17 Nov 2010 | | Contributor(s):: Arvind Raman

  9. ME 597 Lecture 19: VEDA - Scanning Controls

    11 Nov 2010 | | Contributor(s):: Arvind Raman

  10. ME 597 Lecture 18: Stiffness Callibration and Amplitude Modulated Scanning

    20 Oct 2010 | | Contributor(s):: Arvind Raman

    The raw recording for this lecture is all that is available.

  11. ME 597 Lecture 20: Imaging Artifacts in AM-AFM

    27 Jan 2010 | | Contributor(s):: Ron Reifenberger

    Topics:Probe Tip ArtifactsInstrumental ArtifactsLarge Force ArtifactsImage Processing ArtifactsIntrinsic LimitationsTip Cleaning

  12. ME 597 Lecture 16: Analytical Descriptions of AM-AFM, Theory of Phase Contrast

    01 Nov 2009 | | Contributor(s):: Arvind Raman

  13. ME 597 Lecture 13: Point Mass Models, Modeling AM-AFM

    01 Nov 2009 | | Contributor(s):: Arvind Raman

  14. SPMW The Nanomechanics of compositional mapping in amplitude modulation AFM

    05 Jan 2007 | | Contributor(s):: Ricardo Garcia

    Amplitude modulation atomic force microscopy (AM-AFM) has been very successful for imaging with high spatial resolution inorganic as well as soft materials such as polymers, living cells and single biomolecules in their natural environment [1]. The ability of AM-AFM to separate topography from...