Introduction to VEDA: Virtual Environment for Dynamic AFM

26 Sep 2007 | Teaching Materials | Contributor(s): Arvind Raman

This resource has become outdated and has been retired by agreement with the author. Please see the VEDA tool page and supporting documents for current information regarding the VEDA Tool. This …

https://nanohub.org/resources/2754

ME 597 Homework 3:

29 Dec 2010 | Teaching Materials | Contributor(s): Arvind Raman

Problems: Steady state vibration response far from sample Attractive and repulsive regimes of oscillation Practical issues Theory

https://nanohub.org/resources/10239

ME 597 Homework 4: AM-AFM Scans and Basics of FM-AFM

29 Dec 2010 | Teaching Materials | Contributor(s): Ron Reifenberger

Problems: Setting the feedback parameters in AM-AFM scanning Factors Affecting Contrast in dAFM Topographic and Phase Images FM-AFM A dAFM “pocket guide”

https://nanohub.org/resources/10241

ME 597 Lecture 13: Point Mass Models, Modeling AM-AFM

01 Nov 2009 | Online Presentations | Contributor(s): Arvind Raman

https://nanohub.org/resources/7708

ME 597 Lecture 16: Analytical Descriptions of AM-AFM, Theory of Phase Contrast

01 Nov 2009 | Online Presentations | Contributor(s): Arvind Raman

https://nanohub.org/resources/7715

ME 597 Lecture 16: Dynamic Approach Curves in AM-AFM (VEDA Demo)

24 Jan 2011 | Online Presentations | Contributor(s): John Melcher

Guest lecturer: John Melcher. VEDA demonstration.

https://nanohub.org/resources/9960

ME 597 Lecture 17: Cantilever Eigenmodes, Equivalent Point Mass Oscillator, Analytical Approaches

29 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

https://nanohub.org/resources/9961

ME 597 Lecture 18: Stiffness Callibration and Amplitude Modulated Scanning

20 Oct 2010 | Online Presentations | Contributor(s): Arvind Raman

The raw recording for this lecture is all that is available.

https://nanohub.org/resources/7983

ME 597 Lecture 18a: Analytical Approaches

17 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman

https://nanohub.org/resources/9962

ME 597 Lecture 18b: Analytical Approaches - Peak Interaction Forces

17 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman

Peak Force During Tapping - not directly observable.

https://nanohub.org/resources/10013

ME 597 Lecture 19: VEDA - Scanning Controls

11 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman

https://nanohub.org/resources/9993

ME 597 Lecture 20: Imaging Artifacts in AM-AFM

27 Jan 2010 | Online Presentations | Contributor(s): Ron Reifenberger

Topics: Probe Tip Artifacts Instrumental Artifacts Large Force Artifacts Image Processing Artifacts Intrinsic Limitations Tip Cleaning Reading: Paul West, Natalia Starostina, AFM Image …

https://nanohub.org/resources/7985

ME 597 Lecture 20: Scanning Controls (VEDA Demo)

13 Jan 2011 | Online Presentations | Contributor(s): Daniel Kiracofe

Guest lecturer: Daniel Kiracofe. VEDA demonstration.

https://nanohub.org/resources/10060

ME 597 Lecture 24: Using AFM to Measure Electrostatic Forces

07 Dec 2010 | Online Presentations | Contributor(s): Ron Reifenberger

https://nanohub.org/resources/10064

ME 597 Lecture 25: AFM in Liquids I

20 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

https://nanohub.org/resources/10149

ME 597 Lecture 26: AFM in Liquids II

20 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

https://nanohub.org/resources/10150

ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2009)

03 Sep 2009 | Courses | Contributor(s): Ron Reifenberger, Arvind Raman

A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

https://nanohub.org/resources/7320

ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2010)

01 Sep 2010 | Courses | Contributor(s): Ron Reifenberger, Arvind Raman

Fall 2010 A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

https://nanohub.org/resources/9598

SPMW The Nanomechanics of compositional mapping in amplitude modulation AFM

05 Jan 2007 | Online Presentations | Contributor(s): Ricardo Garcia

Amplitude modulation atomic force microscopy (AM-AFM) has been very successful for imaging with high spatial resolution inorganic as well as soft materials such as polymers, living cells and single …

https://nanohub.org/resources/2176