All Categories (1-20 of 23)

1. missing results in amplitude modulated approach curve simulation

   Q&A|Closed | Responses: 0

   The following results are not shown in simulation result. Is it supposed to be so?

   1. Tip-sample interaction force vs Z distance 2. Tip-sample gap vs Z distance 3. Tip-sample interaction...

   https://nanohub.org/answers/question/1258

2. Results missing in simulation of amplitude modulated approach curves

   Q&A|Closed | Responses: 0

   In the tool of...

   https://nanohub.org/answers/question/1439

3. Introduction to VEDA: Virtual Environment for Dynamic AFM

   out of 5 stars 

   26 Sep 2007 | | Contributor(s):: Arvind Raman

   This resource has become outdated and has been retired by agreement with the author. Please see the VEDA tool page and supporting documents for current information regarding the VEDA Tool. This learning module describes the motivation, theory, and features of VEDA- a Virtual Environment for...

4. ME 597 Homework 3:

   out of 5 stars 

   29 Dec 2010 | | Contributor(s):: Arvind Raman

   Problems:Steady state vibration response far from sampleAttractive and repulsive regimes of oscillationPractical issuesTheory

5. ME 597 Homework 4: AM-AFM Scans and Basics of FM-AFM

   out of 5 stars 

   29 Dec 2010 | | Contributor(s):: Ron Reifenberger

   Problems:Setting the feedback parameters in AM-AFM scanningFactors Affecting Contrast in dAFM Topographic and Phase ImagesFM-AFMA dAFM “pocket guide”

6. ME 597 Lecture 13: Point Mass Models, Modeling AM-AFM

   out of 5 stars 

   01 Nov 2009 | | Contributor(s):: Arvind Raman

7. ME 597 Lecture 16: Analytical Descriptions of AM-AFM, Theory of Phase Contrast

   out of 5 stars 

   01 Nov 2009 | | Contributor(s):: Arvind Raman

8. ME 597 Lecture 16: Dynamic Approach Curves in AM-AFM (VEDA Demo)

   out of 5 stars 

   24 Jan 2011 | | Contributor(s):: John Melcher

   Guest lecturer: John Melcher. VEDA demonstration.

9. ME 597 Lecture 17: Cantilever Eigenmodes, Equivalent Point Mass Oscillator, Analytical Approaches

   out of 5 stars 

   29 Dec 2010 | | Contributor(s):: Arvind Raman

10. ME 597 Lecture 18: Stiffness Callibration and Amplitude Modulated Scanning

    out of 5 stars 

    20 Oct 2010 | | Contributor(s):: Arvind Raman

    The raw recording for this lecture is all that is available.

11. ME 597 Lecture 18a: Analytical Approaches

    out of 5 stars 

    17 Nov 2010 | | Contributor(s):: Arvind Raman

12. ME 597 Lecture 18b: Analytical Approaches - Peak Interaction Forces

    out of 5 stars 

    17 Nov 2010 | | Contributor(s):: Arvind Raman

    Peak Force During Tapping - not directly observable.

13. ME 597 Lecture 19: VEDA - Scanning Controls

    out of 5 stars 

    11 Nov 2010 | | Contributor(s):: Arvind Raman

14. ME 597 Lecture 20: Imaging Artifacts in AM-AFM

    out of 5 stars 

    27 Jan 2010 | | Contributor(s):: Ron Reifenberger

    Topics:Probe Tip ArtifactsInstrumental ArtifactsLarge Force ArtifactsImage Processing ArtifactsIntrinsic LimitationsTip Cleaning

15. ME 597 Lecture 20: Scanning Controls (VEDA Demo)

    out of 5 stars 

    13 Jan 2011 | | Contributor(s):: Daniel Kiracofe

    Guest lecturer: Daniel Kiracofe. VEDA demonstration.

16. ME 597 Lecture 24: Using AFM to Measure Electrostatic Forces

    out of 5 stars 

    07 Dec 2010 | | Contributor(s):: Ron Reifenberger

17. ME 597 Lecture 25: AFM in Liquids I

    out of 5 stars 

    20 Dec 2010 | | Contributor(s):: Arvind Raman

18. ME 597 Lecture 26: AFM in Liquids II

    out of 5 stars 

    20 Dec 2010 | | Contributor(s):: Arvind Raman

19. ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2009)

    out of 5 stars 

    03 Sep 2009 | | Contributor(s):: Ron Reifenberger, Arvind Raman

    A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

20. ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2010)

    out of 5 stars 

    01 Sep 2010 | | Contributor(s):: Ron Reifenberger, Arvind Raman

    Fall 2010 A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.