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Tags: atomic force microscopy

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Questions & Answers (1-1 of 1)

  1. AFM imaging of bare silicon surface to measure its rms roughness

    Open | Responses: 1

    Dear Friends,

    my question is related to AFM imaging of silicon surface. after doing phase (AC mode) imaging of silicon surface. i found the roughness of bare silicon surface is ~ 50 nm....

    http://nanohub.org/answers/question/242

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