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Tags: atomic force microscopy

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Resources (1-20 of 109)

  1. ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2010)

    01 Sep 2010 | Courses | Contributor(s): Ron Reifenberger, Arvind Raman

    Fall 2010 A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

    http://nanohub.org/resources/9598

  2. ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2009)

    03 Sep 2009 | Courses | Contributor(s): Ron Reifenberger, Arvind Raman

    A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

    http://nanohub.org/resources/7320

  3. ECET 499N: Introduction to Nanotechnology

    30 Mar 2009 | Courses | Contributor(s): Helen McNally

    An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical...

    http://nanohub.org/resources/6583

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.