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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Members (1-15 of 15)

  1. Bogdan Mihai Neamtu

  2. Heon-Yul Ryu

  3. Kathy Walsh

  4. Tianmao Lai

  5. Aaron Jay Hoover

  6. Ashish Chanana

  7. Tewfik Souier

  8. Filippo Mangolini

  9. Brad Weedon

  10. Nano fundao

    Nanotechnology student 3rd year.

  11. Janusz Strzelecki

  12. Vsevolod Kosulnikov

  13. Irene Revenko

    Irene Revenko is an application scientist for Asylum Research since 2002. Prior to Asylum she was director of the Life Sciences Department at Veeco. Dr. Revenko received two Ph.D.s from Claude...

  14. Frederic Sansoz

  15. Katie M Smith, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.