Tags: atomic force microscopy

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Members (1-16 of 16)

  1. Aaron Jay Hoover

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  2. Amin Vakhshouri

    I am a solid-state physicist, specialized in design, fabrication and electronic characterization of advanced materials using transport and scanning probe microscopy techniques. My research...

    http://nanohub.org/members/73806

  3. Ashish Chanana

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  4. Bogdan Mihai Neamtu

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  5. Brad Weedon

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  6. Filippo Mangolini

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  7. Frederic Sansoz

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  8. Heon-Yul Ryu

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  9. Irene Revenko

    Irene Revenko is an application scientist for Asylum Research since 2002. Prior to Asylum she was director of the Life Sciences Department at Veeco. Dr. Revenko received two Ph.D.s from Claude...

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  10. Janusz Strzelecki

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  11. Kathy Walsh

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  13. Nano fundao

    Nanotechnology student 3rd year.

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  14. Tewfik Souier

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  15. Tianmao Lai

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  16. Vsevolod Kosulnikov

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