Please help us continue to improve nanoHUB operation and service by completing our survey - http://bit.ly/nH-survey14. Thank you - we appreciate your time. close

Support

Support Options

Submit a Support Ticket

 

Tags: atomic force microscopy

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Members (1-12 of 12)

  1. Aaron Jay Hoover

    http://nanohub.org/members/94669

  2. Ashish Chanana

    http://nanohub.org/members/85959

  3. Brad Weedon

    http://nanohub.org/members/69741

  4. Filippo Mangolini

    http://nanohub.org/members/71694

  5. Frederic Sansoz

    http://nanohub.org/members/52609

  6. Irene Revenko

    Irene Revenko is an application scientist for Asylum Research since 2002. Prior to Asylum she was director of the Life Sciences Department at Veeco. Dr. Revenko received two Ph.D.s from Claude...

    http://nanohub.org/members/54763

  7. Janusz Strzelecki

    http://nanohub.org/members/60630

  8. Katie M Smith

    http://nanohub.org/members/38245

  9. Nano fundao

    Nanotechnology student 3rd year.

    http://nanohub.org/members/69058

  10. Tewfik Souier

    http://nanohub.org/members/73657

  11. Tianmao Lai

    http://nanohub.org/members/109578

  12. Vsevolod Kosulnikov

    http://nanohub.org/members/56242

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.