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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
Aaron Jay Hoover
I am a solid-state physicist, specialized in design, fabrication and electronic characterization of advanced materials using transport and scanning probe microscopy techniques. My research...
Bogdan Mihai Neamtu
Katie M Smith