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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
Determining the Mechanics of Living Cells by Atomic Force Microscopy
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21 Apr 2004 | Notes | Contributor(s): Emilie Grzywa Rexeisen
2003 SURI Conference Proceedings
Images for AFM
16 Feb 2009 | Notes | Contributor(s): yan zhang
On the Origin of the Orientation Ratio in Sputtered Longitudinal Media
25 Oct 2012 | Notes | Contributor(s): Brian Demczyk
This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic …
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