Tags: atomic force microscopy

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Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Online Presentations (21-40 of 83)

  1. ME 597 Lecture 18b: Analytical Approaches - Peak Interaction Forces

    17 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman

    Peak Force During Tapping - not directly observable.

    http://nanohub.org/resources/10013

  2. ME 597 Lecture 18a: Analytical Approaches

    17 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/9962

  3. ME 597 Lecture 19: VEDA - Scanning Controls

    11 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/9993

  4. ME 597 Lecture 15: Dynamic Approach Curves

    09 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/9959

  5. ME 597 Lecture 14: Introduction to Dynamic AFM

    04 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/9955

  6. ME 597 Lecture 13: Virtual Environment for Dynamic AFM (VEDA)

    04 Nov 2010 | Online Presentations | Contributor(s): John Melcher

    Guest lecturer: John Melcher. VEDA Demonstration; Overview of Capabilities; F-Z Curve Tool

    http://nanohub.org/resources/9953

  7. ME 597 Lecture 12: Experimental Uncertainties in Extracting Material Properties from F-Z Curves

    29 Oct 2010 | Online Presentations | Contributor(s): Ryan Wagner, Arvind Raman

    Guest lecturer: Ryan Wagner.

    http://nanohub.org/resources/9849

  8. TiCN/TiNbCN Multilayer System with Enhanced Tribological Properties

    20 Oct 2010 | Online Presentations | Contributor(s): Pedro Antonio Prieto

    Improvement in the mechanical properties of hard coatings such monolayer (TiN, CrN, AlCN, WC-Co, TiCN) [1], has been achieved using compositional gradient WC/C layer, or multilayered type...

    http://nanohub.org/resources/9912

  9. ME 597 Lecture 18: Stiffness Callibration and Amplitude Modulated Scanning

    20 Oct 2010 | Online Presentations | Contributor(s): Arvind Raman

    The raw recording for this lecture is all that is available.

    http://nanohub.org/resources/7983

  10. Addressing Molecular Dynamics Time-scale Issues to Study Atomic-scale Friction

    12 Oct 2010 | Online Presentations | Contributor(s): Ashlie Martini

    This presentation will include an introduction to several accelerated molecular dynamics methods. However, particular focus will be given to parallel replica (ParRep) dynamics in which atomistic...

    http://nanohub.org/resources/9856

  11. ME 597 Lecture 11: Three Important Callibrations

    11 Oct 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/9848

  12. ME 597 Lecture 10: Force Distance Curves II

    11 Oct 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/9847

  13. ME 597 Lecture 7: Interaction Forces III

    05 Oct 2010 | Online Presentations

    http://nanohub.org/resources/9731

  14. ME 597 Lecture 8: Introduction to Contact Mechanics

    05 Oct 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    http://nanohub.org/resources/9818

  15. ME 597 Lecture 9: Force Distance Curves I

    20 Sep 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/9732

  16. ME 597 Lecture 6: Interaction Forces II

    16 Sep 2010 | Online Presentations

    http://nanohub.org/resources/9715

  17. ME 597 Lecture 5: Interaction Forces I

    14 Sep 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    See reading references below. Related Reading: J. Israelachvilli, “Intermolecular and surface forces,” Elsevier Science, 2010, 3rd ed. H. J.Butt,B. Cappella, M. Kappl, “Force measurements with...

    http://nanohub.org/resources/9713

  18. ME 597 Lecture 4: The Transition from STM to AFM

    09 Sep 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    Recommended Reading: See References below. G. Binnig, C. Quate and Ch. Gerber, Atomic Force Microscope,

    http://nanohub.org/resources/9685

  19. ME 597 Course Overview

    01 Sep 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    http://nanohub.org/resources/9599

  20. ECET 499N Lecture 12: Scanning Probe Microscopy Applications (in Neuroscience and Beyond)

    12 Apr 2010 | Online Presentations | Contributor(s): Helen McNally

    http://nanohub.org/resources/8837