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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
ME 597 Lecture 18b: Analytical Approaches - Peak Interaction Forces
17 Nov 2010 | | Contributor(s):: Arvind Raman
Peak Force During Tapping - not directly observable.
ME 597 Lecture 18a: Analytical Approaches
ME 597 Lecture 19: VEDA - Scanning Controls
11 Nov 2010 | | Contributor(s):: Arvind Raman
ME 597 Lecture 15: Dynamic Approach Curves
09 Nov 2010 | | Contributor(s):: Arvind Raman
ME 597 Lecture 14: Introduction to Dynamic AFM
04 Nov 2010 | | Contributor(s):: Arvind Raman
ME 597 Lecture 13: Virtual Environment for Dynamic AFM (VEDA)
04 Nov 2010 | | Contributor(s):: John Melcher
Guest lecturer: John Melcher. VEDA Demonstration; Overview of Capabilities; F-Z Curve Tool
ME 597 Lecture 12: Experimental Uncertainties in Extracting Material Properties from F-Z Curves
29 Oct 2010 | | Contributor(s):: Ryan Wagner, Arvind Raman
Guest lecturer: Ryan Wagner.
TiCN/TiNbCN Multilayer System with Enhanced Tribological Properties
20 Oct 2010 | | Contributor(s):: Pedro Antonio Prieto
Improvement in the mechanical properties of hard coatings such monolayer (TiN, CrN, AlCN, WC-Co, TiCN) , has been achieved using compositional gradient WC/C layer, or multilayered type [transition metal/transition carbide]n, [transition metal/transition nitride]n, [TiCN/ZrCN]n, among others....
ME 597 Lecture 18: Stiffness Callibration and Amplitude Modulated Scanning
20 Oct 2010 | | Contributor(s):: Arvind Raman
The raw recording for this lecture is all that is available.
Addressing Molecular Dynamics Time-scale Issues to Study Atomic-scale Friction
12 Oct 2010 | | Contributor(s):: Ashlie Martini
This presentation will include an introduction to several accelerated molecular dynamics methods. However, particular focus will be given to parallel replica (ParRep) dynamics in which atomistic simulations are run parallel in time to extend their total duration. The ParRep method is based on...
ME 597 Lecture 11: Three Important Callibrations
11 Oct 2010 | | Contributor(s):: Arvind Raman
ME 597 Lecture 10: Force Distance Curves II
ME 597 Lecture 7: Interaction Forces III
05 Oct 2010 |
ME 597 Lecture 8: Introduction to Contact Mechanics
05 Oct 2010 | | Contributor(s):: Ron Reifenberger
ME 597 Lecture 9: Force Distance Curves I
20 Sep 2010 | | Contributor(s):: Arvind Raman
ME 597 Lecture 6: Interaction Forces II
16 Sep 2010 |
ME 597 Lecture 5: Interaction Forces I
14 Sep 2010 | | Contributor(s):: Ron Reifenberger
See reading references below.
ME 597 Lecture 4: The Transition from STM to AFM
09 Sep 2010 | | Contributor(s):: Ron Reifenberger
Recommended Reading: See References below.
ME 597 Course Overview
01 Sep 2010 | | Contributor(s):: Ron Reifenberger
ECET 499N Lecture 12: Scanning Probe Microscopy Applications (in Neuroscience and Beyond)
12 Apr 2010 | | Contributor(s):: Helen McNally