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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
SPMW Nonlinear dynamics in AFM - chaos and parametric resonance
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05 Jan 2007 | | Contributor(s):: Arvind Raman
The field of nonlinear dynamics deals with mathematical techniques to study the nonlinear equations that serve as models of physical systems. The benefits of using nonlinear dynamics concepts to interpret and predict probe oscillations in dynamic AFM  are becoming increasingly clear....
SPMW Mechanisms of atomic friction studied by friction force microscopy
12 Dec 2006 | | Contributor(s):: Meyer
Force microscopy is a versatile instrument to investigate physical phenomena on surfaces. The first emphasis is on the study of friction on the nanometer-scale, also called nanotribology. It will be shown that atomic-scale stick-slip is relatively well understood, where the dependence on...
Atomic Force Microscopy
01 Dec 2005 | | Contributor(s):: Arvind Raman
Atomic Force Microscopy (AFM) is an indispensible tool in nano science for the fabrication, metrology, manipulation, and property characterization of nanostructures. This tutorial reviews some of the physics of the interaction forces between the nanoscale tip and sample, the dynamics of the...