Tags: atomic force microscopy

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Online Presentations (41-60 of 83)

  1. ME 597 Lecture 14: Cantilever Eigenmodes

    08 Apr 2010 | | Contributor(s):: Arvind Raman

  2. ME 597 Lecture 8: Interaction Forces II

    08 Mar 2010 | | Contributor(s):: Arvind Raman

  3. ME 597 Lecture 10: Force Distance Curves II

    17 Feb 2010 | | Contributor(s):: Arvind Raman

  4. ME 597 Lecture 27b: Recent Advances in AFM

    16 Feb 2010 | | Contributor(s):: Arvind Raman

    Topics:Multi-Frequency AFMUsing Tuned CantileversMomentary ExcitationPlease note: the slides for this lecture were accidentally lost and a scanned copy of the slide handouts is used. Eventually this lecture will be replaced with a re-constructed set of slides and will be of a quality similar to...

  5. ME 597 Lecture 9: Force Distance Curves I

    10 Feb 2010 | | Contributor(s):: Arvind Raman

  6. ME 597 Lecture 7: Interaction Forces I

    08 Feb 2010 | | Contributor(s):: Arvind Raman

    From interatomic and intermolecular forces to tip-sample interaction forces.

  7. ME 597 Lecture 22: Frequency Modulated AFM - Experimental Details

    02 Feb 2010 | | Contributor(s):: Ron Reifenberger

  8. ME 597 Lecture 21: Frequency Modulated AFM

    02 Feb 2010 | | Contributor(s):: Ron Reifenberger

  9. ME 597 Lecture 20: Imaging Artifacts in AM-AFM

    27 Jan 2010 | | Contributor(s):: Ron Reifenberger

    Topics:Probe Tip ArtifactsInstrumental ArtifactsLarge Force ArtifactsImage Processing ArtifactsIntrinsic LimitationsTip Cleaning

  10. Illinois ME 498 Introduction of Nano Science and Technology, Lecture 20: Sensing and Actuation in Nanoscale

    17 Dec 2009 | | Contributor(s):: Nick Fang, Omar N Sobh

    Sensing and Actuation in NanoscaleTopics: Scanning Tunneling Microscopy Two Modes of Forming STM Images STM Manipulation Atomic Force Microscopy Typical Engaging Curve Imaging in Fluid Shear Force Sensing by Tuning Fork Tip Shape Effects: Containment Tip Shape Effect: Cone Angle Other Imaging...

  11. ME 597 Lecture 27a: Recent Advances in AFM

    14 Dec 2009 | | Contributor(s):: Ron Reifenberger

    Topics:Unifying ThemeTaking advantage of cantilever modes

  12. ME 597 Lecture 23: FM-AFM Selected Results

    08 Dec 2009 | | Contributor(s):: Ron Reifenberger

    Topics:FM-AFM Selected Results/li>Achieving Atomic Resolution with AFM

  13. ME 597 Lecture 28: Other Emerging dAFM Techniques

    08 Dec 2009 | | Contributor(s):: Arvind Raman

    Topics:Multi-frequency AFMSub-surface imagingHigh-speed/video rate AFM

  14. ME 597 Lecture 25: Using the AFM to Measure Electrostatic Forces

    02 Dec 2009 | | Contributor(s):: Ron Reifenberger

  15. ME 597 Lecture 17: Imaging or Peak Forces in Tapping Mode AFM

    01 Nov 2009 | | Contributor(s):: Arvind Raman

  16. ME 597 Lecture 16: Analytical Descriptions of AM-AFM, Theory of Phase Contrast

    01 Nov 2009 | | Contributor(s):: Arvind Raman

  17. ME 597 Lecture 13: Point Mass Models, Modeling AM-AFM

    01 Nov 2009 | | Contributor(s):: Arvind Raman

  18. ME 597 Lecture 12: Introduction to Dynamic AFM – Point Mass Approximation

    01 Nov 2009 | | Contributor(s):: Arvind Raman

  19. ME 597 Lecture 6: The Transition from STM to AFM

    26 Oct 2009 | | Contributor(s):: Ron Reifenberger

  20. ME 597 Lecture 2: Electron States in Solids-Density of States

    09 Sep 2009 | | Contributor(s):: Ron Reifenberger

    Note: This lecture has been revised since its original presentation.Topics:Electron States in Solids – Bloch FunctionsKronig-Penney ModelDensity of States