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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
[Illinois] GEM4 2012: 3D Microscopy, Confocal, Multiphoton & SHG Microscopy
29 Dec 2012 | | Contributor(s):: Peter So
Our objective is to educate researchers and graduate students about the fundamentals of cell and molecular biomechanics, and to provide an intense learning experience, and to facilitate interactions among engineers, biologists and clinicians. The goals are to help train a new generation of...
BME 695L Special Lecture 4: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)
02 Dec 2011 | | Contributor(s):: Helen McNally
Guest lecturer: Helen McNally
Illinois 2011 NanoBiophotonics Summer School: Poster Day: Peng Huang
29 Nov 2011 | | Contributor(s):: Peng Huang, Nadia Jassim
Local raster scanning of high speed imaging of polymers in atomic force microscopy.
Introduction to Birck Scanning Probe Microscopy Center
03 May 2011 | | Contributor(s):: Xin Xu
This presentation gives an introduction to the AFM facility and AFM related research being conducted in Birck nanotechnology center (BNC), and also some useful AFM resources.
Atomic Force Microscopy: Applications for Life Science Research
03 May 2011 | | Contributor(s):: Irene Revenko
This presentation presents the principles of AFM and demonstrates the applications in Life Sciences. We will also discuss key points about the technology, and more particularly, the technical characteristics you should understand when using an AFM such as noise level, limitations of the...
Force Measurements in AFM
03 May 2011 | | Contributor(s):: Amir Moshar
AFM Metrology of Cellulose Nanocrystals
03 May 2011 | | Contributor(s):: Robert J. Moon, Ryan Wagner
This talk discusses the characterization of cellulose nanocrystals via atomic force microscopy.
Electronic Characterization of Materials Using Conductive AFM
AFM Sample Preparation in Biology
All biological samples are different, the key is to start with established recipes for similar samples, then adapt the procedures for a different one. We'll present guidelines for choosing a substrate, immobilizing the sample, choosing the proper cantilever, as well as tips and tricks optimize...
ME 597 Lecture 22: Frequency Modulated AFM: Experimental Details
14 Feb 2011 | | Contributor(s):: Ron Reifenberger
ME 597 Lecture 16: Dynamic Approach Curves in AM-AFM (VEDA Demo)
24 Jan 2011 | | Contributor(s):: John Melcher
Guest lecturer: John Melcher. VEDA demonstration.
ME 597 Lecture 20: Scanning Controls (VEDA Demo)
13 Jan 2011 | | Contributor(s):: Daniel Kiracofe
Guest lecturer: Daniel Kiracofe. VEDA demonstration.
ME 597 Lecture 17: Cantilever Eigenmodes, Equivalent Point Mass Oscillator, Analytical Approaches
29 Dec 2010 | | Contributor(s):: Arvind Raman
ME 597 Lecture 25: AFM in Liquids I
20 Dec 2010 | | Contributor(s):: Arvind Raman
ME 597 Lecture 26: AFM in Liquids II
ME 597 Lecture 27: Other Emerging dAFM Techniques
ME 597A Lecture 7: Uncertainty Quantification in Experiments
16 Dec 2010 | | Contributor(s):: Arvind Raman
Guest Lecture Arvind Raman.
ME 597 Lecture 24: Using AFM to Measure Electrostatic Forces
07 Dec 2010 | | Contributor(s):: Ron Reifenberger
ME 597 Lecture 23: FM-AFM Selected Results and Achieving Atomic Resolution with AFM
ME 597 Lecture 21: Frequency Modulated AFM
22 Nov 2010 | | Contributor(s):: Ron Reifenberger