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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
SPMW Nanomechanics: from nanotechnology to biology
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12 Dec 2006 | Online Presentations | Contributor(s): Elisa Riedo
The development of new materials with size of few nanometers has opened a new field of scientific and technological research. The goal is to develop faster and better communication systems and …
SPMW Nonlinear dynamics in AFM - chaos and parametric resonance
05 Jan 2007 | Online Presentations | Contributor(s): Arvind Raman
The field of nonlinear dynamics deals with mathematical techniques to study the nonlinear equations that serve as models of physical systems. The benefits of using nonlinear dynamics concepts to …
SPMW Mechanisms of atomic friction studied by friction force microscopy
12 Dec 2006 | Online Presentations | Contributor(s): Ernst Meyer
Force microscopy is a versatile instrument to investigate physical phenomena on surfaces. The first emphasis is on the study of friction on the nanometer-scale, also called nanotribology. It will be …
Atomic Force Microscopy
01 Dec 2005 | Online Presentations | Contributor(s): Arvind Raman
Atomic Force Microscopy (AFM) is an indispensible tool in nano science for the fabrication, metrology, manipulation, and property characterization of nanostructures. This tutorial reviews some of the …
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