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Tags: atomic force microscopy

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Resources (1-20 of 109)

  1. Determining the Mechanics of Living Cells by Atomic Force Microscopy

    21 Apr 2004 | Presentation Materials | Contributor(s): Emilie Grzywa Rexeisen

    2003 SURI Conference Proceedings

    http://nanohub.org/resources/811

  2. Images for AFM

    17 Feb 2009 | Presentation Materials | Contributor(s): yan zhang

    http://nanohub.org/resources/6275

  3. Interface Structure/Surface Morphology of (Co,Fe,Ni)/Cu/Si Thin Films

    25 Mar 2014 | Presentation Materials | Contributor(s): Brian Demczyk, R. Naik, A. Lukaszew, G. W. Auner, V. M. Naik

    The effects of thin film and interfacial stress on the magnetic properties Fe, Co and Ni films deposited by molecular beam epitaxy on Cu underlayers (Si substrate) were examined, employing...

    http://nanohub.org/resources/20737

  4. On the Origin of the Orientation Ratio in Sputtered Longitudinal Media

    26 Oct 2012 | Presentation Materials | Contributor(s): Brian Demczyk

    This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining...

    http://nanohub.org/resources/15606

  5. Texture-Induced hcp c-axis Alignment in Longitudinal Media

    15 Jul 2013 | Presentation Materials | Contributor(s): Brian Demczyk

    This presentation discusses the development and measurement of c-axis text in longitudinal hard disk media.

    http://nanohub.org/resources/18917

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