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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
[Illinois] Experimental Methods: AFM/Optical and Magnetic Traps
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29 Dec 2012 | Online Presentations | Contributor(s): Peter So
On the Origin of the Orientation Ratio in Sputtered Longitudinal Media
26 Oct 2012 | Notes | Contributor(s): Brian Demczyk
This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic …
VEDA First-time User Manual
07 Aug 2012 | Teaching Materials | Contributor(s): John Melcher, Daniel Kiracofe, Shuiqing Hu, Steven Douglas Johnson, Sudharsan Balasubramaniam, Arvind Raman
This document is intended to be a “quickstart” guide to get new users running their first simulations with VEDA, walking the user through two easy examples. After completing these simple …
This is a comprehensive manual for the VEDA (VIRTUAL ENVIRONMENT FOR DYNAMIC AFM) Version 2.0 simulation tool.
VEDA: Virtual Environment for Dynamic AFM
30 May 2012 | Tools | Contributor(s): Daniel Kiracofe, John Melcher, Arvind Raman, Sudharsan Balasubramaniam, Steven Douglas Johnson, Shuiqing Hu
A suite of dynamic AFM simulators for air/liquid/vacuum on soft or hard samples.
BME 695L Special Lecture 4: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)
02 Dec 2011 | Online Presentations | Contributor(s): Helen McNally
Guest lecturer: Helen McNally
Illinois 2011 NanoBiophotonics Summer School: Poster Day: Peng Huang
17 Nov 2011 | Online Presentations | Contributor(s): Peng Huang, Nadia Jassim
Local raster scanning of high speed imaging of polymers in atomic force microscopy.
Base Motion Calculations
17 Jun 2011 | Tools | Contributor(s): Daniel Kiracofe
Automates the calculations in the paper by Kiracofe and Raman, Nanotechnology, 2011
Introduction to Birck Scanning Probe Microscopy Center
21 Mar 2011 | Online Presentations | Contributor(s): Xin Xu
This presentation gives an introduction to the AFM facility and AFM related research being conducted in Birck nanotechnology center (BNC), and also some useful AFM resources.
Asylum Research Atomic Force Microscopy (AFM) Workshop
21 Mar 2011 | Workshops
This workshop includes lectures and equipment/imaging demonstrations for both life science applications and electrical characterization of materials.
Atomic Force Microscopy: Applications for Life Science Research
21 Mar 2011 | Online Presentations | Contributor(s): Irene Revenko
This presentation presents the principles of AFM and demonstrates the applications in Life Sciences. We will also discuss key points about the technology, and more particularly, the technical …
Force Measurements in AFM
21 Mar 2011 | Online Presentations | Contributor(s): Amir Moshar
Purdue University Discovery Park, Asylum Research
AFM Metrology of Cellulose Nanocrystals
21 Mar 2011 | Online Presentations | Contributor(s): Robert J. Moon, Ryan Wagner
This talk discusses the characterization of cellulose nanocrystals via atomic force microscopy.
Electronic Characterization of Materials Using Conductive AFM
AFM Sample Preparation in Biology
22 Mar 2011 | Online Presentations | Contributor(s): Irene Revenko
All biological samples are different, the key is to start with established recipes for similar samples, then adapt the procedures for a different one. We'll present guidelines for choosing a …
ME 597 Lecture 22: Frequency Modulated AFM: Experimental Details
22 Nov 2010 | Online Presentations | Contributor(s): Ron Reifenberger
ME 597 Lecture 16: Dynamic Approach Curves in AM-AFM (VEDA Demo)
04 Nov 2010 | Online Presentations | Contributor(s): John Melcher
Guest lecturer: John Melcher. VEDA demonstration.
ME 597 Lecture 20: Scanning Controls (VEDA Demo)
22 Nov 2010 | Online Presentations | Contributor(s): Daniel Kiracofe
Guest lecturer: Daniel Kiracofe. VEDA demonstration.
ME 597 Homework 4: AM-AFM Scans and Basics of FM-AFM
29 Dec 2010 | Teaching Materials | Contributor(s): Ron Reifenberger
Problems: Setting the feedback parameters in AM-AFM scanning Factors Affecting Contrast in dAFM Topographic and Phase Images FM-AFM A dAFM “pocket guide”
ME 597 Homework 3:
29 Dec 2010 | Teaching Materials | Contributor(s): Arvind Raman
Problems: Steady state vibration response far from sample Attractive and repulsive regimes of oscillation Practical issues Theory
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