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Tags: atomic force microscopy

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Resources (21-40 of 109)

  1. ME 597 Lecture 20: Scanning Controls (VEDA Demo)

    13 Jan 2011 | Online Presentations | Contributor(s): Daniel Kiracofe

    Guest lecturer: Daniel Kiracofe. VEDA demonstration.

    http://nanohub.org/resources/10060

  2. ME 597 Homework 4: AM-AFM Scans and Basics of FM-AFM

    29 Dec 2010 | Teaching Materials | Contributor(s): Ron Reifenberger

    Problems: Setting the feedback parameters in AM-AFM scanning Factors Affecting Contrast in dAFM Topographic and Phase Images FM-AFM A dAFM “pocket guide”

    http://nanohub.org/resources/10241

  3. ME 597 Homework 3:

    29 Dec 2010 | Teaching Materials | Contributor(s): Arvind Raman

    Problems: Steady state vibration response far from sample Attractive and repulsive regimes of oscillation Practical issues Theory

    http://nanohub.org/resources/10239

  4. ME 597 Lecture 17: Cantilever Eigenmodes, Equivalent Point Mass Oscillator, Analytical Approaches

    29 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/9961

  5. ME 597 Lecture 25: AFM in Liquids I

    20 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/10149

  6. ME 597 Lecture 26: AFM in Liquids II

    20 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/10150

  7. ME 597 Lecture 27: Other Emerging dAFM Techniques

    20 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/10151

  8. Uncertainty Quantification in Experiments

    16 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

    An overview is provided of how experimental data should be reported with true uncertainties. Examples from experiments on gas damping measurements in RF switches and for estimation of...

    http://nanohub.org/resources/10035

  9. ME 597 Lecture 24: Using AFM to Measure Electrostatic Forces

    07 Dec 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    http://nanohub.org/resources/10064

  10. ME 597 Lecture 23: FM-AFM Selected Results and Achieving Atomic Resolution with AFM

    07 Dec 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    http://nanohub.org/resources/10063

  11. ME 597 Lecture 21: Frequency Modulated AFM

    22 Nov 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    http://nanohub.org/resources/10061

  12. ME 597 Lecture 18b: Analytical Approaches - Peak Interaction Forces

    17 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman

    Peak Force During Tapping - not directly observable.

    http://nanohub.org/resources/10013

  13. ME 597 Lecture 18a: Analytical Approaches

    17 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/9962

  14. ME 597 Lecture 19: VEDA - Scanning Controls

    11 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/9993

  15. ME 597 Lecture 15: Dynamic Approach Curves

    09 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/9959

  16. ME 597 Lecture 14: Introduction to Dynamic AFM

    04 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/9955

  17. ME 597 Lecture 13: Virtual Environment for Dynamic AFM (VEDA)

    04 Nov 2010 | Online Presentations | Contributor(s): John Melcher

    Guest lecturer: John Melcher. VEDA Demonstration; Overview of Capabilities; F-Z Curve Tool

    http://nanohub.org/resources/9953

  18. ME 597 Lecture 12: Experimental Uncertainties in Extracting Material Properties from F-Z Curves

    29 Oct 2010 | Online Presentations | Contributor(s): Ryan Wagner, Arvind Raman

    Guest lecturer: Ryan Wagner.

    http://nanohub.org/resources/9849

  19. TiCN/TiNbCN Multilayer System with Enhanced Tribological Properties

    20 Oct 2010 | Online Presentations | Contributor(s): Pedro Antonio Prieto

    Improvement in the mechanical properties of hard coatings such monolayer (TiN, CrN, AlCN, WC-Co, TiCN) [1], has been achieved using compositional gradient WC/C layer, or multilayered type...

    http://nanohub.org/resources/9912

  20. ME 597 Lecture 18: Stiffness Callibration and Amplitude Modulated Scanning

    20 Oct 2010 | Online Presentations | Contributor(s): Arvind Raman

    The raw recording for this lecture is all that is available.

    http://nanohub.org/resources/7983

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