Tags: atomic force microscopy (AFM)

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Resources (21-40 of 141)

  1. [Illinois] Interphase Chemical Mapping Of Carbon Fiber-epoxy Composites By AFM-IR Spectroscopy

    13 Apr 2017 | | Contributor(s):: Chris Montgomery

    The properties and performance of carbon fiber reinforced polymer matrix composites are highly influenced by the chemical interactions of the fiber/matrix interface region. Many researchers have hypothesized that the presence of carbon fibers in epoxy causes a chemical gradient to form around the...

  2. Learning Module: Microcantilevers - Instructor Materials

    09 Feb 2017 | | Contributor(s):: Southwest Center for Microsystems Education (SCME)

    ­This learning module is an overview of microcantilevers, how they work and how they are used in micro and nanotechnology.  These are the instructor materials.

  3. Learning Module: Microcantilevers

    09 Feb 2017 | | Contributor(s):: Southwest Center for Microsystems Education (SCME)

    This learning module introduces you to the microcantilever, its applications in micro and nanotechnologies, its use in sensor arrays, and how it works in both static and dynamic modes of operation.  There is a pre and post-test, four (4) informational units (PKs), and two (2)...

  4. High Accuracy Atomic Force Microscope with Self-Optimizing Scan Control

    19 Sep 2016 | | Contributor(s):: Ryan (Young-kook) Yoo

    Atomic force microscope (AFM) is a very useful instrument in characterizing nanoscale features, However, the original AFM design, based on piezo-tube scanner, had slow response and non-orthogonal behavior, inadequate to address the metrology needs of industrial applications: accuracy,...

  5. [Illinois] AMC 2016 workshop: Quantitative AM-FM mode for fast and versatile imaging of nanoscale elastic modulus

    13 Jun 2016 | | Contributor(s):: Marta Kocun

    Advanced Material Characterization Workshop June 7-8 2016 Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign  

  6. [Illinois] AMC 2016 workshop: In-situ and real time study of SEI formation on anode in a Lithium battery cell using atomic force microscope

    13 Jun 2016 | | Contributor(s):: Song Xu

    Advanced Material Characterization Workshop June 7-8 2016 Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign  

  7. [Illinois] AFM indentation tests reveal the poroelastic nature of the cytoplasm

    19 Nov 2015 | | Contributor(s):: Emad Moeendarbary

  8. Structure and Morphology of Silicon-Germanium Thin Films

    07 Feb 2015 | | Contributor(s):: Brian Demczyk

    This presentation describes the growth of (Si,Ge & SiGe) thin films on Si and Ge (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition (UHVCVD). Thin films were characterized structurally by conventional and high-resolution transmission electron microscopy (TEM) and...

  9. MATLAB-based blind tip reconstruction algorithms

    01 Aug 2014 | | Contributor(s):: Erin Flater, Charles Clifford

    We are making available for download our MATLAB-based blind tip reconstruction algorithms. These algorithms are based on the code published in J. Villarrubia, "Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation", Journal of Research...

  10. Interface Structure/Surface Morphology of (Co,Fe,Ni)/Cu/Si Thin Films

    25 Mar 2014 | | Contributor(s):: Brian Demczyk, R. Naik, A. Lukaszew, G. W. Auner, V. M. Naik

    The effects of thin film and interfacial stress on the magnetic properties Fe, Co and Ni films deposited by molecular beam epitaxy on Cu underlayers (Si substrate) were examined, employing transmission,ans scanning probe microscopy and reflection high energy diffraction. It ws found that the...

  11. Structure and Morphology of Silicon Germanium Thin Films

    30 Dec 2013 | | Contributor(s):: Brian Demczyk

    Single layer silicon and germanium films as well as nominally 50-50 silicon-germanium alloys were deposited on single crystal silicon and germanium (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition. These films spanned the range of + 4 % film-substrate lattice mismatch. A...

  12. Texture-Induced hcp c-axis Alignment in Longitudinal Media

    15 Jul 2013 | | Contributor(s):: Brian Demczyk

    This presentation discusses the development and measurement of c-axis text in longitudinal hard disk media.

  13. [Illinois] GEM4 2012: 3D Microscopy, Confocal, Multiphoton & SHG Microscopy

    29 Dec 2012 | | Contributor(s):: Peter So

    Our objective is to educate researchers and graduate students about the fundamentals of cell and molecular biomechanics, and to provide an intense learning experience, and to facilitate interactions among engineers, biologists and clinicians. The goals are to help train a new generation of...

  14. On the Origin of the Orientation Ratio in Sputtered Longitudinal Media

    26 Oct 2012 | | Contributor(s):: Brian Demczyk

    This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic properties in longitudinal recording media. fabricated hard disks were characterized by...

  15. VEDA First-time User Manual

    07 Aug 2012 | | Contributor(s):: John Melcher, Daniel Kiracofe, Shuiqing Hu, Steven Douglas Johnson, Sudharsan Balasubramaniam, Arvind Raman

    This document is intended to be a “quickstart” guide to get new users running their first simulations with VEDA, walking the user through two easy examples. After completing these simple examples, the user is referred to the comprehensive manual for a more detailed description and additional...

  16. VEDA Manual

    07 Aug 2012 | | Contributor(s):: John Melcher, Daniel Kiracofe, Shuiqing Hu, Steven Douglas Johnson, Sudharsan Balasubramaniam, Arvind Raman

    This is a comprehensive manual for the VEDA (VIRTUAL ENVIRONMENT FOR DYNAMIC AFM) Version 2.0 simulation tool.

  17. VEDA: Virtual Environment for Dynamic AFM

    30 May 2012 | | Contributor(s):: Daniel Kiracofe, John Melcher, Arvind Raman, Sudharsan Balasubramaniam, Steven Douglas Johnson, Shuiqing Hu

    A suite of dynamic AFM simulators for air/liquid/vacuum on soft or hard samples.

  18. Near-field radiative heat transfer and Casimir Force Measurement

    19 Dec 2009 | | Contributor(s):: Joel Chevrier

    This presentation first makes a simple introduction on how the charge fluctuations give rises to these effects that are nowadays most effectively detected using MEMS or AFM technologies. This will lead to question the relevance of these effects in the use of MEMS. After description of our...

  19. Nanoscale Spectroscopy and Plasmonics in Infrared

    09 Mar 2012 | | Contributor(s):: Mikhail Belkin

    In this talk, I will present the results of two of our research projects. I will start with a simple technique for nanoscale mid-infrared spectroscopy that we have developed recently. Subwavelength resolution is achieved by detecting optical absorption through measuring local photothermal...

  20. BME 695L Special Lecture 4: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)

    02 Dec 2011 | | Contributor(s):: Helen McNally

    Guest lecturer: Helen McNally