Tags: atomic force microscopy

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Resources (41-60 of 109)

  1. ME 597 Lecture 18: Stiffness Callibration and Amplitude Modulated Scanning

    20 Oct 2010 | | Contributor(s):: Arvind Raman

    The raw recording for this lecture is all that is available.

  2. ME 597 Teaching Materials: Homeworks (Fall 2010)

    18 Oct 2010 | | Contributor(s):: Ron Reifenberger, Arvind Raman

    Homework materials for the Fall 2010 teaching of ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy.

  3. ME 597 Homework 2: AFM Cantilevers

    18 Oct 2010 | | Contributor(s):: Arvind Raman

  4. ME 597 Homework 1: Quantum Transmission

    18 Oct 2010 | | Contributor(s):: Ron Reifenberger

    Problems:Transmission through a Square BarrierTransmission resonances for an array of square barriersA simple model for the vdW interaction

  5. Addressing Molecular Dynamics Time-scale Issues to Study Atomic-scale Friction

    12 Oct 2010 | | Contributor(s):: Ashlie Martini

    This presentation will include an introduction to several accelerated molecular dynamics methods. However, particular focus will be given to parallel replica (ParRep) dynamics in which atomistic simulations are run parallel in time to extend their total duration. The ParRep method is based on...

  6. ME 597 Lecture 11: Three Important Callibrations

    11 Oct 2010 | | Contributor(s):: Arvind Raman

  7. ME 597 Lecture 10: Force Distance Curves II

    11 Oct 2010 | | Contributor(s):: Arvind Raman

  8. ME 597 Lecture 7: Interaction Forces III

    05 Oct 2010 |

  9. ME 597 Lecture 8: Introduction to Contact Mechanics

    05 Oct 2010 | | Contributor(s):: Ron Reifenberger

  10. ME 597 Lecture 9: Force Distance Curves I

    20 Sep 2010 | | Contributor(s):: Arvind Raman

  11. ME 597 Lecture 6: Interaction Forces II

    16 Sep 2010 |

  12. ME 597 Lecture 5: Interaction Forces I

    14 Sep 2010 | | Contributor(s):: Ron Reifenberger

    See reading references below.

  13. ME 597 Lecture 4: The Transition from STM to AFM

    09 Sep 2010 | | Contributor(s):: Ron Reifenberger

    Recommended Reading: See References below.

  14. ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2010)

    01 Sep 2010 | | Contributor(s):: Ron Reifenberger, Arvind Raman

    Fall 2010A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

  15. ME 597 Course Overview

    01 Sep 2010 | | Contributor(s):: Ron Reifenberger

  16. ECET 499N Lecture 12: Scanning Probe Microscopy Applications (in Neuroscience and Beyond)

    12 Apr 2010 | | Contributor(s):: Helen McNally

  17. ME 597 Lecture 14: Cantilever Eigenmodes

    08 Apr 2010 | | Contributor(s):: Arvind Raman

  18. ME 597 Lecture 8: Interaction Forces II

    08 Mar 2010 | | Contributor(s):: Arvind Raman

  19. ME 597 Lecture 10: Force Distance Curves II

    17 Feb 2010 | | Contributor(s):: Arvind Raman

  20. ME 597 Lecture 27b: Recent Advances in AFM

    16 Feb 2010 | | Contributor(s):: Arvind Raman

    Topics:Multi-Frequency AFMUsing Tuned CantileversMomentary ExcitationPlease note: the slides for this lecture were accidentally lost and a scanned copy of the slide handouts is used. Eventually this lecture will be replaced with a re-constructed set of slides and will be of a quality similar to...