Support

Support Options

Submit a Support Ticket

 
Home › Tags › atomic force microscopy › Resources

Tags: atomic force microscopy

Categories

Note: Results do not include pending, unpublished, and some private items.

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Resources (21-40 of 106)

  1. ME 597 Lecture 17: Cantilever Eigenmodes, Equivalent Point Mass Oscillator, Analytical Approaches

    This resource has a 10.0 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 600
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    29 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

    https://nanohub.org/resources/9961

  2. ME 597 Lecture 25: AFM in Liquids I

    This resource has a 5.6 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 420
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    20 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

    https://nanohub.org/resources/10149

  3. ME 597 Lecture 26: AFM in Liquids II

    This resource has a 5.3 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 347
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    20 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

    https://nanohub.org/resources/10150

  4. ME 597 Lecture 27: Other Emerging dAFM Techniques

    This resource has a 5.3 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 294
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    20 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

    https://nanohub.org/resources/10151

  5. Uncertainty Quantification in Experiments

    This resource has a 5.1 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 68
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    16 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

    An overview is provided of how experimental data should be reported with true uncertainties. Examples from experiments on gas damping measurements in RF switches and for estimation of nanoparticles …

    https://nanohub.org/resources/10035

  6. ME 597 Lecture 24: Using AFM to Measure Electrostatic Forces

    This resource has a 5.4 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 356
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    07 Dec 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    https://nanohub.org/resources/10064

  7. ME 597 Lecture 23: FM-AFM Selected Results and Achieving Atomic Resolution with AFM

    This resource has a 5.6 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 337
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    07 Dec 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    https://nanohub.org/resources/10063

  8. ME 597 Lecture 21: Frequency Modulated AFM

    This resource has a 5.7 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 393
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    22 Nov 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    https://nanohub.org/resources/10061

  9. ME 597 Lecture 18b: Analytical Approaches - Peak Interaction Forces

    This resource has a 5.8 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 322
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    17 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman

    Peak Force During Tapping - not directly observable.

    https://nanohub.org/resources/10013

  10. ME 597 Lecture 18a: Analytical Approaches

    This resource has a 5.8 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 348
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    17 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman

    https://nanohub.org/resources/9962

  11. ME 597 Lecture 19: VEDA - Scanning Controls

    This resource has a 5.8 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 388
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    11 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman

    https://nanohub.org/resources/9993

  12. ME 597 Lecture 15: Dynamic Approach Curves

    This resource has a 6.0 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 437
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    09 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman

    https://nanohub.org/resources/9959

  13. ME 597 Lecture 14: Introduction to Dynamic AFM

    This resource has a 6.1 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 563
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    04 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman

    https://nanohub.org/resources/9955

  14. ME 597 Lecture 13: Virtual Environment for Dynamic AFM (VEDA)

    This resource has a 5.7 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 337
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    04 Nov 2010 | Online Presentations | Contributor(s): John Melcher

    Guest lecturer: John Melcher. VEDA Demonstration; Overview of Capabilities; F-Z Curve Tool

    https://nanohub.org/resources/9953

  15. ME 597 Lecture 12: Experimental Uncertainties in Extracting Material Properties from F-Z Curves

    This resource has a 5.8 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 394
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    29 Oct 2010 | Online Presentations | Contributor(s): Ryan Wagner, Arvind Raman

    Guest lecturer: Ryan Wagner.

    https://nanohub.org/resources/9849

  16. TiCN/TiNbCN Multilayer System with Enhanced Tribological Properties

    This resource has a 5.0 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 63
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    20 Oct 2010 | Online Presentations | Contributor(s): Pedro Antonio Prieto

    Improvement in the mechanical properties of hard coatings such monolayer (TiN, CrN, AlCN, WC-Co, TiCN) [1], has been achieved using compositional gradient WC/C layer, or multilayered type …

    https://nanohub.org/resources/9912

  17. ME 597 Lecture 18: Stiffness Callibration and Amplitude Modulated Scanning

    This resource has a 5.3 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 139
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    20 Oct 2010 | Online Presentations | Contributor(s): Arvind Raman

    The raw recording for this lecture is all that is available.

    https://nanohub.org/resources/7983

  18. ME 597 Teaching Materials: Homeworks (Fall 2010)

    This resource has a 5.1 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 552
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    18 Oct 2010 | Series | Contributor(s): Ron Reifenberger, Arvind Raman

    Homework materials for the Fall 2010 teaching of ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy.

    https://nanohub.org/resources/9890

  19. ME 597 Homework 2: AFM Cantilevers

    This resource has a 5.3 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 63
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    18 Oct 2010 | Teaching Materials | Contributor(s): Arvind Raman

    https://nanohub.org/resources/9887

  20. ME 597 Homework 1: Quantum Transmission

    This resource has a 5.6 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 07 Jun 2013
    Users: 249
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    18 Oct 2010 | Teaching Materials | Contributor(s): Ron Reifenberger

    Problems: Transmission through a Square Barrier Transmission resonances for an array of square barriers A simple model for the vdW interaction

    https://nanohub.org/resources/9885

Get Help

Get Involved

Legal

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies.