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Tags: atomic force microscopy

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Resources (101-109 of 109)

  1. Toward Improving the Precision of Nanoscale Force-Displacement Measurements

    13 Mar 2007 | Online Presentations | Contributor(s): Jason Clark

    Nanotechnology has great potential for being used to create better medicines, materials, and sensors. With increasing interest in nanotechnology to improve the quality of our lives, there...

    http://nanohub.org/resources/2452

  2. Frontiers in Scanning Probe Microscopy

    30 Nov 2006 | Workshops

    From October 4- 6, 2006 the Birck Nanotechnology Center at Purdue University hosted a three day focused workshop on cutting edge SPM techniques that are under development throughout the...

    http://nanohub.org/resources/2035

  3. SPMW Interplay between theory and experiment in AFM nanomechanical studies of polymers

    30 Nov 2006 | Online Presentations | Contributor(s): Sergei Magonov, Sergey Belikov

    High-resolution imaging of surfaces and compositional mapping of heterogeneous materials are the main functions of atomic force microscopy (AFM) in studies of polymer materials. Compositional...

    http://nanohub.org/resources/2030

  4. SPMW Nanotube, nanoneedle and nanomeniscus: mechanical and wetting properties of modified AFM tip apex

    12 Dec 2006 | Online Presentations | Contributor(s): J. P. Aimé

    Among AFM microscopes, Dynamic force microscopes (DFM) are very sensitive to variation of minute forces involved in the interaction between the tip and the surface. However, despite numerous...

    http://nanohub.org/resources/2103

  5. SPMW Nanomechanics: from nanotechnology to biology

    12 Dec 2006 | Online Presentations | Contributor(s): Elisa Riedo

    The development of new materials with size of few nanometers has opened a new field of scientific and technological research. The goal is to develop faster and better communication systems and...

    http://nanohub.org/resources/2101

  6. SPMW Nonlinear dynamics in AFM - chaos and parametric resonance

    05 Jan 2007 | Online Presentations | Contributor(s): Arvind Raman

    The field of nonlinear dynamics deals with mathematical techniques to study the nonlinear equations that serve as models of physical systems. The benefits of using nonlinear dynamics concepts to...

    http://nanohub.org/resources/2238

  7. SPMW Mechanisms of atomic friction studied by friction force microscopy

    12 Dec 2006 | Online Presentations | Contributor(s): Ernst Meyer

    Force microscopy is a versatile instrument to investigate physical phenomena on surfaces. The first emphasis is on the study of friction on the nanometer-scale, also called nanotribology. It will...

    http://nanohub.org/resources/2102

  8. Atomic Force Microscopy

    01 Dec 2005 | Online Presentations | Contributor(s): Arvind Raman

    Atomic Force Microscopy (AFM) is an indispensible tool in nano science for the fabrication, metrology, manipulation, and property characterization of nanostructures. This tutorial reviews some of...

    http://nanohub.org/resources/520

  9. Determining the Mechanics of Living Cells by Atomic Force Microscopy

    21 Apr 2004 | Presentation Materials | Contributor(s): Emilie Grzywa Rexeisen

    2003 SURI Conference Proceedings

    http://nanohub.org/resources/811

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