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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
ME 597 Introductory Lecture
01 Sep 2009 | | Contributor(s):: Ron Reifenberger
Nanotribology, Nanomechanics and Materials Characterization Studies
08 Jun 2009 | | Contributor(s):: Bharat Bhushan
Fundamental nanotribological studies provide insight to molecular origins of interfacial phenomena including adhesion, friction, wear and lubrication. Friction and wear of lightly loaded micro/nano components are highly dependent on the surface interactions (few atomic layers). Nanotribological...
ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | | Contributor(s):: Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...
Images for AFM
17 Feb 2009 | | Contributor(s):: yan zhang
VEDA 2.0 (Virtual Environment for Dynamic AFM)
28 Aug 2008 | | Contributor(s):: John Melcher, Daniel Kiracofe, Shuiqing Hu, Arvind Raman
There is a new version of this tool which can be found here. Please use that tool instead
Gas Damping of Microcantilevers at Low Ambient Pressures
out of 5 stars
03 Nov 2008 | | Contributor(s):: Rahul Anil Bidkar
This seminar will present a theoretical model for predicting the gas damping of long, rectangular silicon microcantilevers, which are oscillating in an unbounded gaseous medium with the ambient pressures varying over 5 orders of magnitude (1000 > Kn > 0.03). The work is the result of a...
SUGARCube - Cantilever
01 May 2008 | | Contributor(s):: Fengyuan Li, Brandon Patterson, Jason Clark, yi zeng
Cantilever modeling and simulation with different loads
So What do Biologist, Biotechnologists & Pharmaceutical Scientist Want With an AFM/SPM Anyway?
11 Sep 2008 | | Contributor(s):: Kunal Bose
BNC Research Review: Carbon Nanotubes as Nucleic Acid Carriers
04 Jun 2008 | | Contributor(s):: Don Bergstrom
This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.
SPMW Scanning Probe Acceleration Microscopy: Towards Real Time Reconstruction of Tip-Sample Forces in Tapping Mode AFM
05 Jan 2007 | | Contributor(s):: Tomasz Kowalewski
Tapping mode atomic force microscopy (TMAFM) in fluids has become an increasingly important technique, especially in studying biological samples under near physiological conditions. However, until recently the physics of tapping mode operation under fluids has not been well understood. The first...
SPMW Single molecule recognition atomic force microscopy
05 Jan 2007 | | Contributor(s):: Peter Hinterdorfer
In molecular recognition force microscopy (MRFM), ligands are covalently attached to atomic force microscopy tips for the molecular recognition of their cognitive receptors on probe surfaces. A ligand-containing tip is approached towards the receptors on the probe surface, which possibly leads to...
BME 695N Lecture 9: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)
30 Sep 2007 | | Contributor(s):: Helen McNally
What Helen McNally as guest lecturer.
Introduction to VEDA: Virtual Environment for Dynamic AFM
26 Sep 2007 | | Contributor(s):: Arvind Raman
This resource has become outdated and has been retired by agreement with the author. Please see the VEDA tool page and supporting documents for current information regarding the VEDA Tool. This learning module describes the motivation, theory, and features of VEDA- a Virtual Environment for...
Oligodeoxyribonucleotide Association with Single-Walled Carbon Nanotubes
02 Aug 2007 | | Contributor(s):: Jennifer McDonald
Commercially available single-walled carbon nanotubes (SWCNTs) tend to aggregate as ropes and bundles during production making them of little use in many scientific and industrial applications. An effective technique for dispersing and solubilizing SWCNTs is required to fully utilize their unique...
Re-engineering a Healthy Eye Tissue to Restore Damaged Eyesight
02 Aug 2007 | | Contributor(s):: Margarita Shalaev
Age-related macular degeneration (AMD) is an eye disease that is the leading cause of blindness in the USA and Western Europe. It affects over one million people in the United States alone. One of the symptoms of AMD is a diseased Bruch’s membrane, which is an important layer in the eye. Our...
SPMW A fresh look to amplitude-modulation AFM: Force minimization, interaction measurement, and the quest for high resolution
05 Jan 2007 | | Contributor(s):: Udo D. Schwarz
Frequency modulation atomic force microscopy (FM-AFM) has been able to deliver high-resolution atomic-scale images in ultrahigh vacuum for over one decade. In addition, there have been recent reports where atomic resolution has been achieved in air and liquids using FM-AFM . Achieving...
SPMW AFM at Video Rate and Beyond
16 May 2007 | | Contributor(s):: Mervyn Miles
The particular advantages that atomic force microscopy (AFM) has over other types of microscopy are well-known, but it has the one major disadvantage of low imaging rates in conventional instruments in which each image requires typically a minute or more to collect. This has two major detrimental...
SPMW The Nanomechanics of compositional mapping in amplitude modulation AFM
05 Jan 2007 | | Contributor(s):: Ricardo Garcia
Amplitude modulation atomic force microscopy (AM-AFM) has been very successful for imaging with high spatial resolution inorganic as well as soft materials such as polymers, living cells and single biomolecules in their natural environment . The ability of AM-AFM to separate topography from...
BNC Annual Research Symposium: Metrology and Nanomaterials Characterization
10 May 2007 | | Contributor(s):: Ron Reifenberger
SPMW FIRAT: A fast and sensitive probe structure for SPM
05 Jan 2007 | | Contributor(s):: F. Levent Degertekin
A new SPM probe, called the force sensing integrated readout and active tip (FIRAT), is described and initial experimental results obtained on commercial AFM systems are presented. FIRAT combines a micromachined integrated electrostatic actuator to move the tip and an integrated optical...