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Characterization - Atomic Force Microscopy
12 Jan 2022 | | Contributor(s):: Wesley C. Sanders, NACK Network
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Determining the Mechanics of Living Cells by Atomic Force Microscopy
21 Apr 2004 | | Contributor(s):: Emilie Grzywa Rexeisen
2003 SURI Conference Proceedings
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ECET 499N Lecture 12: Scanning Probe Microscopy Applications (in Neuroscience and Beyond)
12 Apr 2010 | | Contributor(s):: Helen McNally
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ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | | Contributor(s):: Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...
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Electronic Characterization of Materials Using Conductive AFM
21 Mar 2011 | | Contributor(s):: Amir Moshar
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Fabrication and Characterization of Nanostructures Using AFM
25 Feb 2022 | | Contributor(s):: Wesley C. Sanders, Glen Johnson, NACK Network
The atomic force microscope (AFM) is a versatile characterization tool that allows users to acquire high-resolution images of nanoscale surface features. In addition to probing nanoscale surface topography, AFMs can be used to print nanoscale structures using additive and subtractive lithographic...
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Force Measurements in AFM
21 Mar 2011 | | Contributor(s):: Amir Moshar
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Frontiers in Scanning Probe Microscopy
30 Nov 2006 |
From October 4- 6, 2006 the Birck Nanotechnology Center at Purdue University hosted a three day focused workshop on cutting edge SPM techniques that are under development throughout the world.The three day workshop featured thematically arranged invited talks. The workshop themes are...
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Fundamentals of Metrology and Characterization for Nanotechnology
12 Mar 2019 | | Contributor(s):: Diane Hickey-Davis, NACK Network
Outline:How do we see what we can’t see?Five common nanotech instrumentsFor each, I’ll cover:What it doesHow it worksWhere it’s used in IndustryWhat subjects you can teach with itWhat skills your students can learn from it
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Gas Damping of Microcantilevers at Low Ambient Pressures
03 Nov 2008 | | Contributor(s):: Rahul Anil Bidkar
This seminar will present a theoretical model for predicting the gas damping of long, rectangular silicon microcantilevers, which are oscillating in an unbounded gaseous medium with the ambient pressures varying over 5 orders of magnitude (1000 > Kn > 0.03). The work is the result of a...
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High Accuracy Atomic Force Microscope with Self-Optimizing Scan Control
19 Sep 2016 | | Contributor(s):: Ryan (Young-kook) Yoo
Atomic force microscope (AFM) is a very useful instrument in characterizing nanoscale features, However, the original AFM design, based on piezo-tube scanner, had slow response and non-orthogonal behavior, inadequate to address the metrology needs of industrial applications: accuracy,...
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Illinois 2011 NanoBiophotonics Summer School: Poster Day: Peng Huang
29 Nov 2011 | | Contributor(s):: Peng Huang, Nadia Jassim
Local raster scanning of high speed imaging of polymers in atomic force microscopy.
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Illinois ME 498 Introduction of Nano Science and Technology, Lecture 20: Sensing and Actuation in Nanoscale
17 Dec 2009 | | Contributor(s):: Nick Fang, Omar N Sobh
Sensing and Actuation in NanoscaleTopics: Scanning Tunneling Microscopy Two Modes of Forming STM Images STM Manipulation Atomic Force Microscopy Typical Engaging Curve Imaging in Fluid Shear Force Sensing by Tuning Fork Tip Shape Effects: Containment Tip Shape Effect: Cone Angle Other Imaging...
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Images for AFM
17 Feb 2009 | | Contributor(s):: yan zhang
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Interface Structure/Surface Morphology of (Co,Fe,Ni)/Cu/Si Thin Films
25 Mar 2014 | | Contributor(s):: Brian Demczyk, R. Naik, A. Lukaszew, G. W. Auner, V. M. Naik
The effects of thin film and interfacial stress on the magnetic properties Fe, Co and Ni films deposited by molecular beam epitaxy on Cu underlayers (Si substrate) were examined, employing transmission,ans scanning probe microscopy and reflection high energy diffraction. It ws found that the...
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Introduction to Birck Scanning Probe Microscopy Center
03 May 2011 | | Contributor(s):: Xin Xu
This presentation gives an introduction to the AFM facility and AFM related research being conducted in Birck nanotechnology center (BNC), and also some useful AFM resources.
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Introduction to VEDA: Virtual Environment for Dynamic AFM
26 Sep 2007 | | Contributor(s):: Arvind Raman
This resource has become outdated and has been retired by agreement with the author. Please see the VEDA tool page and supporting documents for current information regarding the VEDA Tool. This learning module describes the motivation, theory, and features of VEDA- a Virtual Environment for...
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Learning Module: Microcantilevers
09 Feb 2017 | | Contributor(s):: Southwest Center for Microsystems Education (SCME)
This learning module introduces you to the microcantilever, its applications in micro and nanotechnologies, its use in sensor arrays, and how it works in both static and dynamic modes of operation. There is a pre and post-test, four (4) informational units (PKs), and two (2)...
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Learning Module: Microcantilevers - Instructor Materials
09 Feb 2017 | | Contributor(s):: Southwest Center for Microsystems Education (SCME)
This learning module is an overview of microcantilevers, how they work and how they are used in micro and nanotechnology. These are the instructor materials.
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MATLAB-based blind tip reconstruction algorithms
01 Aug 2014 | | Contributor(s):: Erin Flater, Charles Clifford
We are making available for download our MATLAB-based blind tip reconstruction algorithms. These algorithms are based on the code published in J. Villarrubia, "Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation", Journal of Research...