Tags: atomic force microscopy

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Resources (1-20 of 109)

  1. Addressing Molecular Dynamics Time-scale Issues to Study Atomic-scale Friction

    12 Oct 2010 | | Contributor(s):: Ashlie Martini

    This presentation will include an introduction to several accelerated molecular dynamics methods. However, particular focus will be given to parallel replica (ParRep) dynamics in which atomistic simulations are run parallel in time to extend their total duration. The ParRep method is based on...

  2. AFM Metrology of Cellulose Nanocrystals

    03 May 2011 | | Contributor(s):: Robert J. Moon, Ryan Wagner

    This talk discusses the characterization of cellulose nanocrystals via atomic force microscopy.

  3. AFM Sample Preparation in Biology

    03 May 2011 | | Contributor(s):: Irene Revenko

    All biological samples are different, the key is to start with established recipes for similar samples, then adapt the procedures for a different one. We'll present guidelines for choosing a substrate, immobilizing the sample, choosing the proper cantilever, as well as tips and tricks optimize...

  4. Asylum Research Atomic Force Microscopy (AFM) Workshop

    03 May 2011 |

    This workshop includes lectures and equipment/imaging demonstrations for both life science applications and electrical characterization of materials.

  5. Atomic Force Microscopy

    01 Dec 2005 | | Contributor(s):: Arvind Raman

    Atomic Force Microscopy (AFM) is an indispensible tool in nano science for the fabrication, metrology, manipulation, and property characterization of nanostructures. This tutorial reviews some of the physics of the interaction forces between the nanoscale tip and sample, the dynamics of the...

  6. Atomic Force Microscopy: Applications for Life Science Research

    21 Mar 2011 | | Contributor(s):: Irene Revenko

    This presentation presents the principles of AFM and demonstrates the applications in Life Sciences. We will also discuss key points about the technology, and more particularly, the technical characteristics you should understand when using an AFM such as noise level, limitations of the...

  7. Base Motion Calculations

    17 Jun 2011 | | Contributor(s):: Daniel Kiracofe

    Automates the calculations in the paper by Kiracofe and Raman, Nanotechnology, 2011

  8. BME 695L Special Lecture 4: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)

    02 Dec 2011 | | Contributor(s):: Helen McNally

    Guest lecturer: Helen McNally

  9. BME 695N Lecture 9: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)

    30 Sep 2007 | | Contributor(s):: Helen McNally

    What Helen McNally as guest lecturer.

  10. BNC Annual Research Symposium: Metrology and Nanomaterials Characterization

    10 May 2007 | | Contributor(s):: Ron Reifenberger

    This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.

  11. BNC Research Review: Carbon Nanotubes as Nucleic Acid Carriers

    04 Jun 2008 | | Contributor(s)::

    This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.

  12. Determining the Mechanics of Living Cells by Atomic Force Microscopy

    21 Apr 2004 | | Contributor(s):: Emilie Grzywa Rexeisen

    2003 SURI Conference Proceedings

  13. ECET 499N Lecture 12: Scanning Probe Microscopy Applications (in Neuroscience and Beyond)

    12 Apr 2010 | | Contributor(s):: Helen McNally

  14. ECET 499N: Introduction to Nanotechnology

    30 Mar 2009 | | Contributor(s):: Helen McNally

    An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...

  15. Electronic Characterization of Materials Using Conductive AFM

    21 Mar 2011 | | Contributor(s):: Amir Moshar

  16. Force Measurements in AFM

    21 Mar 2011 | | Contributor(s):: Amir Moshar

  17. Frontiers in Scanning Probe Microscopy

    30 Nov 2006 |

    From October 4- 6, 2006 the Birck Nanotechnology Center at Purdue University hosted a three day focused workshop on cutting edge SPM techniques that are under development throughout the world.The three day workshop featured thematically arranged invited talks. The workshop themes are broadly...

  18. Gas Damping of Microcantilevers at Low Ambient Pressures

    03 Nov 2008 | | Contributor(s):: Rahul Anil Bidkar

    This seminar will present a theoretical model for predicting the gas damping of long, rectangular silicon microcantilevers, which are oscillating in an unbounded gaseous medium with the ambient pressures varying over 5 orders of magnitude (1000 > Kn > 0.03). The work is the result of a...

  19. Illinois 2011 NanoBiophotonics Summer School: Poster Day: Peng Huang

    29 Nov 2011 | | Contributor(s):: Peng Huang, Nadia Jassim

    Local raster scanning of high speed imaging of polymers in atomic force microscopy.

  20. Illinois ME 498 Introduction of Nano Science and Technology, Lecture 20: Sensing and Actuation in Nanoscale

    17 Dec 2009 | | Contributor(s):: Nick Fang, Omar N Sobh

    Sensing and Actuation in NanoscaleTopics: Scanning Tunneling Microscopy Two Modes of Forming STM Images STM Manipulation Atomic Force Microscopy Typical Engaging Curve Imaging in Fluid Shear Force Sensing by Tuning Fork Tip Shape Effects: Containment Tip Shape Effect: Cone Angle Other Imaging...