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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
Introduction to VEDA: Virtual Environment for Dynamic AFM
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26 Sep 2007 | Teaching Materials | Contributor(s): Arvind Raman
This resource has become outdated and has been retired by agreement with the author. Please see the VEDA tool page and supporting documents for current information regarding the VEDA Tool. This...
ME 597 Homework 1: Quantum Transmission
18 Oct 2010 | Teaching Materials | Contributor(s): Ron Reifenberger
Transmission through a Square Barrier
Transmission resonances for an array of square barriers
A simple model for the vdW interaction
ME 597 Homework 2: AFM Cantilevers
18 Oct 2010 | Teaching Materials | Contributor(s): Arvind Raman
ME 597 Homework 3:
29 Dec 2010 | Teaching Materials | Contributor(s): Arvind Raman
Steady state vibration response far from sample
Attractive and repulsive regimes of oscillation
ME 597 Homework 4: AM-AFM Scans and Basics of FM-AFM
29 Dec 2010 | Teaching Materials | Contributor(s): Ron Reifenberger
Setting the feedback parameters in AM-AFM scanning
Factors Affecting Contrast in dAFM Topographic and Phase Images
A dAFM “pocket guide”
VEDA First-time User Manual
07 Aug 2012 | Teaching Materials | Contributor(s): John Melcher, Daniel Kiracofe, Shuiqing Hu, Steven Douglas Johnson, Sudharsan Balasubramaniam, Arvind Raman
This document is intended to be a “quickstart” guide to get new users running their first simulations with VEDA, walking the user through two easy examples. After completing these simple...
This is a comprehensive manual for the VEDA (VIRTUAL ENVIRONMENT FOR DYNAMIC AFM) Version 2.0 simulation tool.