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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
Base Motion Calculations
17 Jun 2011 | | Contributor(s):: Daniel Kiracofe
Automates the calculations in the paper by Kiracofe and Raman, Nanotechnology, 2011
SUGARCube - Cantilever
01 May 2008 | | Contributor(s):: Fengyuan Li, Brandon Patterson, Jason Clark, yi zeng
Cantilever modeling and simulation with different loads
VEDA 2.0 (Virtual Environment for Dynamic AFM)
28 Aug 2008 | | Contributor(s):: John Melcher, Daniel Kiracofe, Shuiqing Hu, Arvind Raman
There is a new version of this tool which can be found here. Please use that tool instead
VEDA: Amplitude Modulated Scanning
20 Oct 2009 | | Contributor(s):: John Melcher, Shuiqing Hu, Arvind Raman, Steven Douglas Johnson, Daniel Kiracofe
This tool is being replaced by VEDA 2.0. Use that tool instead.
VEDA: Dynamic Approach Curves
15 Mar 2007 | | Contributor(s):: John Melcher, Shuiqing Hu, Steven Douglas Johnson, Daniel Kiracofe, Arvind Raman
VEDA: Virtual Environment for Dynamic AFM
30 May 2012 | | Contributor(s):: Daniel Kiracofe, John Melcher, Arvind Raman, Sudharsan Balasubramaniam, Steven Douglas Johnson, Shuiqing Hu
A suite of dynamic AFM simulators for air/liquid/vacuum on soft or hard samples.