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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
Asylum Research Atomic Force Microscopy (AFM) Workshop
03 May 2011 | Workshops
This workshop includes lectures and equipment/imaging demonstrations for both life science applications and electrical characterization of materials.
Frontiers in Scanning Probe Microscopy
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30 Nov 2006 | Workshops
From October 4- 6, 2006 the Birck Nanotechnology Center at Purdue University hosted a three day focused workshop on cutting edge SPM techniques that are under development throughout the...