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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
[Illinois] Experimental Methods: AFM/Optical and Magnetic Traps
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29 Dec 2012 | Online Presentations | Contributor(s): Peter So
On the Origin of the Orientation Ratio in Sputtered Longitudinal Media
26 Oct 2012 | Notes | Contributor(s): Brian Demczyk
This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic …
VEDA First-time User Manual
07 Aug 2012 | Teaching Materials | Contributor(s): John Melcher, Daniel Kiracofe, Shuiqing Hu, Steven Douglas Johnson, Sudharsan Balasubramaniam, Arvind Raman
This document is intended to be a “quickstart” guide to get new users running their first simulations with VEDA, walking the user through two easy examples. After completing these simple …
This is a comprehensive manual for the VEDA (VIRTUAL ENVIRONMENT FOR DYNAMIC AFM) Version 2.0 simulation tool.
Nanotechnology student 3rd year.
VEDA: Virtual Environment for Dynamic AFM
30 May 2012 | Tools | Contributor(s): Daniel Kiracofe, John Melcher, Arvind Raman, Sudharsan Balasubramaniam, Steven Douglas Johnson, Shuiqing Hu
A suite of dynamic AFM simulators for air/liquid/vacuum on soft or hard samples.
Jun 06 2012
Illinois AMC 2012 6th Advanced Materials Characterization Workshop
This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will …
BME 695L Special Lecture 4: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)
02 Dec 2011 | Online Presentations | Contributor(s): Helen McNally
Guest lecturer: Helen McNally
Illinois 2011 NanoBiophotonics Summer School: Poster Day: Peng Huang
17 Nov 2011 | Online Presentations | Contributor(s): Peng Huang, Nadia Jassim
Local raster scanning of high speed imaging of polymers in atomic force microscopy.
Base Motion Calculations
17 Jun 2011 | Tools | Contributor(s): Daniel Kiracofe
Automates the calculations in the paper by Kiracofe and Raman, Nanotechnology, 2011
Irene Revenko is an application scientist for Asylum Research since 2002. Prior to Asylum she was director of the Life Sciences Department at Veeco. Dr. Revenko received two Ph.D.s from Claude …
AFM Metrology of Cellulose Nanocrystals
21 Mar 2011 | Online Presentations | Contributor(s): Robert J. Moon, Ryan Wagner
This talk discusses the characterization of cellulose nanocrystals via atomic force microscopy.
AFM Sample Preparation in Biology
22 Mar 2011 | Online Presentations | Contributor(s): Irene Revenko
All biological samples are different, the key is to start with established recipes for similar samples, then adapt the procedures for a different one. We'll present guidelines for choosing a …
Asylum Research Atomic Force Microscopy (AFM) Workshop
21 Mar 2011 | Workshops
This workshop includes lectures and equipment/imaging demonstrations for both life science applications and electrical characterization of materials.
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