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Advanced Scanning Probe Microscopy I
01 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
OutlinePart 1: This LectureOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: Can be viewed hereCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation
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Advanced Scanning Probe Microscopy II
01 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
OutlinePart 1: Can be viewed hereOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: This LectureCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation
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AFM And EBSD Cross-Comparison Analysis Tool
14 Aug 2018 | | Contributor(s):: Andrew Martin Krawec, John Blendell, Matthew John Michie
Ceramic and semiconductor research is limited in its ability to create holistic representations of data in concise, easily-accessible file formats or visual data representations. These materials are used in everyday electronics, and optimizing their electrical and physical properties is...
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Carbon Nanotube Counter
08 Aug 2018 | | Contributor(s):: Quinn Lennemann
Carbon Nanotube Counter (CNT Counter) is a program that can count the density of Carbon Nanotubes in microscope scans. The program supports JPEG and TIFF images from both Scanning Electron Microscopes (SEMs) and Atomic Force Microscopes (AFMs). This program contains both an automatic mode and a...
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The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale
20 Jul 2018 | | Contributor(s):: Stephen J. Fonash, NACK Network
OutlineThe tools for characterizing materials and structures at the nano-scaleProbesPhoton beamsElectron beamsIon beamsAcoustic waves
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Himanshu Patel
https://nanohub.org/members/198194
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Advances in Ambient and Liquid AFM - Nanoscale Structure and Dynamics
08 Dec 2017 | | Contributor(s):: Roger Proksch
In this talk, we will explore some recent results in observations of structure and dynamics in a variety of systems ranging from polymer dynamics in ambient conditions, 3D atomic resolution mapping of the structure of the solid-liquid interface, defect dynamics in crystal lattice and biologically...
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[Illinois] Interphase Chemical Mapping Of Carbon Fiber-epoxy Composites By AFM-IR Spectroscopy
13 Apr 2017 | | Contributor(s):: Chris Montgomery
The properties and performance of carbon fiber reinforced polymer matrix composites are highly influenced by the chemical interactions of the fiber/matrix interface region. Many researchers have hypothesized that the presence of carbon fibers in epoxy causes a chemical gradient to form around the...
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Learning Module: Microcantilevers - Instructor Materials
09 Feb 2017 | | Contributor(s):: Southwest Center for Microsystems Education (SCME)
This learning module is an overview of microcantilevers, how they work and how they are used in micro and nanotechnology. These are the instructor materials.
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Learning Module: Microcantilevers
09 Feb 2017 | | Contributor(s):: Southwest Center for Microsystems Education (SCME)
This learning module introduces you to the microcantilever, its applications in micro and nanotechnologies, its use in sensor arrays, and how it works in both static and dynamic modes of operation. There is a pre and post-test, four (4) informational units (PKs), and two (2)...
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High Accuracy Atomic Force Microscope with Self-Optimizing Scan Control
19 Sep 2016 | | Contributor(s):: Ryan (Young-kook) Yoo
Atomic force microscope (AFM) is a very useful instrument in characterizing nanoscale features, However, the original AFM design, based on piezo-tube scanner, had slow response and non-orthogonal behavior, inadequate to address the metrology needs of industrial applications: accuracy,...
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Jul 25 2016
International Conference on Non-Contact Atomic Force Microscopy
NC-AFM 2016 will be held at the East Midlands Conference Centre at the University of Nottingham and is the 19th conference in the International Non-contact Atomic Force Microscopy (NC-AFM)...
https://nanohub.org/events/details/1466
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[Illinois] AMC 2016 workshop: In-situ and real time study of SEI formation on anode in a Lithium battery cell using atomic force microscope
13 Jun 2016 | | Contributor(s):: Song Xu
Advanced Material Characterization Workshop June 7-8 2016 Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign
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[Illinois] AMC 2016 workshop: Quantitative AM-FM mode for fast and versatile imaging of nanoscale elastic modulus
13 Jun 2016 | | Contributor(s):: Marta Kocun
Advanced Material Characterization Workshop June 7-8 2016 Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign
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Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode
Blog
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19 May 2016 |
Posted by Rostislav Vladimirovich Lapshin
R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode, Applied Surface Science, vol. 378, pp. 530-539, 2016 (DOI:...
https://nanohub.org/members/112015/blog/2016/05/research-article-drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in
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Jhon Pazos Alonso
https://nanohub.org/members/145014
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Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description
Blog
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04 Dec 2015 |
Posted by Rostislav Vladimirovich Lapshin
R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description, Applied Surface Science, vol. 359, pp. 629-636, 2015 (DOI:...
https://nanohub.org/members/112015/blog/2015/12/drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in-nanometer-range-approach
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[Illinois] AFM indentation tests reveal the poroelastic nature of the cytoplasm
19 Nov 2015 | | Contributor(s):: Emad Moeendarbary
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Bogdan Mihai Neamtu
https://www.linkedin.com/profile/view?id=AAIAAApgIH8BjDdkIuCzTZsuJkYAtcSLwNBoBRA&trk=nav_responsive_tab_profile
https://nanohub.org/members/134289
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Heon-Yul Ryu
https://nanohub.org/members/134189