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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
Bogdan Mihai Neamtu
Structure and Morphology of Silicon-Germanium Thin Films
07 Feb 2015 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation describes the growth of (Si,Ge & SiGe) thin films on Si and Ge (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition (UHVCVD). Thin films were...
Interface Structure/Surface Morphology of (Co,Fe,Ni)/Cu/Si Thin Films
25 Mar 2014 | Presentation Materials | Contributor(s): Brian Demczyk, R. Naik, A. Lukaszew, G. W. Auner, V. M. Naik
The effects of thin film and interfacial stress on the magnetic properties Fe, Co and Ni films deposited by molecular beam epitaxy on Cu underlayers (Si substrate) were examined, employing...
Aaron Jay Hoover
Structure and Morphology of Silicon Germanium Thin Films
30 Dec 2013 | Papers | Contributor(s): Brian Demczyk
Single layer silicon and germanium films as well as nominally 50-50 silicon-germanium alloys were deposited on single crystal silicon and germanium (001) and (111) substrates by ultrahigh vacuum...
Texture-Induced hcp c-axis Alignment in Longitudinal Media
15 Jul 2013 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation discusses the development and measurement of c-axis text in longitudinal hard disk media.
[Illinois] GEM4 2012: 3D Microscopy, Confocal, Multiphoton & SHG Microscopy
29 Dec 2012 | Online Presentations | Contributor(s): Peter So
Our objective is to educate researchers and graduate students about the fundamentals of cell and molecular biomechanics, and to provide an intense learning experience, and to facilitate...
I am a solid-state physicist, specialized in design, fabrication and electronic characterization of advanced materials using transport and scanning probe microscopy techniques. My research...
On the Origin of the Orientation Ratio in Sputtered Longitudinal Media
26 Oct 2012 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining...
VEDA First-time User Manual
07 Aug 2012 | Teaching Materials | Contributor(s): John Melcher, Daniel Kiracofe, Shuiqing Hu, Steven Douglas Johnson, Sudharsan Balasubramaniam, Arvind Raman
This document is intended to be a “quickstart” guide to get new users running their first simulations with VEDA, walking the user through two easy examples. After completing these simple...
This is a comprehensive manual for the VEDA (VIRTUAL ENVIRONMENT FOR DYNAMIC AFM) Version 2.0 simulation tool.
VEDA: Virtual Environment for Dynamic AFM
0.0 out of 5 stars
30 May 2012 | Tools | Contributor(s): Daniel Kiracofe, John Melcher, Arvind Raman, Sudharsan Balasubramaniam, Steven Douglas Johnson, Shuiqing Hu
A suite of dynamic AFM simulators for air/liquid/vacuum on soft or hard samples.