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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
Frontiers in Scanning Probe Microscopy
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12 Feb 2007 | Workshops
From October 4- 6, 2006 the Birck Nanotechnology Center at Purdue University hosted a three day focused workshop on cutting edge SPM techniques that are under development throughout the...
SPMW Interplay between theory and experiment in AFM nanomechanical studies of polymers
12 Feb 2007 | Online Presentations | Contributor(s): Sergei Magonov, Sergey Belikov
High-resolution imaging of surfaces and compositional mapping of heterogeneous materials are the main functions of atomic force microscopy (AFM) in studies of polymer materials. Compositional...
SPMW Nanotube, nanoneedle and nanomeniscus: mechanical and wetting properties of modified AFM tip apex
08 Feb 2007 | Online Presentations | Contributor(s): J. P. AimÃ©
Among AFM microscopes, Dynamic force microscopes (DFM) are very sensitive to variation of minute forces involved in the interaction between the tip and the surface. However, despite numerous...
SPMW Nanomechanics: from nanotechnology to biology
08 Feb 2007 | Online Presentations | Contributor(s): Elisa Riedo
The development of new materials with size of few nanometers has opened a new field of scientific and technological research. The goal is to develop faster and better communication systems and...
SPMW Nonlinear dynamics in AFM - chaos and parametric resonance
08 Feb 2007 | Online Presentations | Contributor(s): Arvind Raman
The field of nonlinear dynamics deals with mathematical techniques to study the nonlinear equations that serve as models of physical systems. The benefits of using nonlinear dynamics concepts to...
SPMW Mechanisms of atomic friction studied by friction force microscopy
13 Jan 2007 | Online Presentations | Contributor(s): Ernst Meyer
Force microscopy is a versatile instrument to investigate physical phenomena on surfaces. The first emphasis is on the study of friction on the nanometer-scale, also called nanotribology. It will...
Atomic Force Microscopy
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29 Nov 2005 | Online Presentations | Contributor(s): Arvind Raman
Atomic Force Microscopy (AFM) is an indispensible tool in nano science for the fabrication, metrology, manipulation, and property characterization of nanostructures. This tutorial reviews some of...
Determining the Mechanics of Living Cells by Atomic Force Microscopy
21 Apr 2004 | Presentation Materials | Contributor(s): Emilie Grzywa Rexeisen
2003 SURI Conference Proceedings