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Tags: atomic force microscopy

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

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  1. SPMW Mechanisms of atomic friction studied by friction force microscopy

    12 Dec 2006 | Online Presentations | Contributor(s): Ernst Meyer

    Force microscopy is a versatile instrument to investigate physical phenomena on surfaces. The first emphasis is on the study of friction on the nanometer-scale, also called nanotribology. It will...

    http://nanohub.org/resources/2102

  2. Atomic Force Microscopy

    01 Dec 2005 | Online Presentations | Contributor(s): Arvind Raman

    Atomic Force Microscopy (AFM) is an indispensible tool in nano science for the fabrication, metrology, manipulation, and property characterization of nanostructures. This tutorial reviews some of...

    http://nanohub.org/resources/520

  3. Determining the Mechanics of Living Cells by Atomic Force Microscopy

    21 Apr 2004 | Presentation Materials | Contributor(s): Emilie Grzywa Rexeisen

    2003 SURI Conference Proceedings

    http://nanohub.org/resources/811

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