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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
Jun 06 2012
Illinois AMC 2012 6th Advanced Materials Characterization Workshop
BME 695L Special Lecture 4: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)
02 Dec 2011 | Online Presentations | Contributor(s): Helen McNally
Guest lecturer: Helen McNally
Illinois 2011 NanoBiophotonics Summer School: Poster Day: Peng Huang
29 Nov 2011 | Online Presentations | Contributor(s): Peng Huang, Nadia Jassim
Local raster scanning of high speed imaging of polymers in atomic force microscopy.
Base Motion Calculations
0.0 out of 5 stars
17 Jun 2011 | Tools | Contributor(s): Daniel Kiracofe
Automates the calculations in the paper by Kiracofe and Raman, Nanotechnology, 2011
AFM Metrology of Cellulose Nanocrystals
03 May 2011 | Online Presentations | Contributor(s): Robert J. Moon, Ryan Wagner
This talk discusses the characterization of cellulose nanocrystals via atomic force microscopy.
AFM Sample Preparation in Biology
03 May 2011 | Online Presentations | Contributor(s): Irene Revenko
All biological samples are different, the key is to start with established recipes for similar samples, then adapt the procedures for a different one. We'll present guidelines for choosing a...
Asylum Research Atomic Force Microscopy (AFM) Workshop
03 May 2011 | Workshops
This workshop includes lectures and equipment/imaging demonstrations for both life science applications and electrical characterization of materials.
Atomic Force Microscopy: Applications for Life Science Research
This presentation presents the principles of AFM and demonstrates the applications in Life Sciences. We will also discuss key points about the technology, and more particularly, the technical...
Electronic Characterization of Materials Using Conductive AFM
03 May 2011 | Online Presentations | Contributor(s): Amir Moshar
Purdue University Discovery Park,
Force Measurements in AFM
Introduction to Birck Scanning Probe Microscopy Center
03 May 2011 | Online Presentations | Contributor(s): Xin Xu
This presentation gives an introduction to the AFM facility and AFM related research being conducted in Birck nanotechnology center (BNC), and also some useful AFM resources.
ME 597 Lecture 22: Frequency Modulated AFM: Experimental Details
14 Feb 2011 | Online Presentations | Contributor(s): Ron Reifenberger
ME 597 Lecture 16: Dynamic Approach Curves in AM-AFM (VEDA Demo)
24 Jan 2011 | Online Presentations | Contributor(s): John Melcher
Guest lecturer: John Melcher. VEDA demonstration.
ME 597 Lecture 20: Scanning Controls (VEDA Demo)
13 Jan 2011 | Online Presentations | Contributor(s): Daniel Kiracofe
Guest lecturer: Daniel Kiracofe. VEDA demonstration.
ME 597 Homework 4: AM-AFM Scans and Basics of FM-AFM
29 Dec 2010 | Teaching Materials | Contributor(s): Ron Reifenberger
Setting the feedback parameters in AM-AFM scanning
Factors Affecting Contrast in dAFM Topographic and Phase Images
A dAFM “pocket guide”
ME 597 Homework 3:
29 Dec 2010 | Teaching Materials | Contributor(s): Arvind Raman
Steady state vibration response far from sample
Attractive and repulsive regimes of oscillation