Tags: atomic force microscopy


Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

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  1. VEDA: Virtual Environment for Dynamic AFM

    18 Jun 2012 | Tools | Contributor(s): Daniel Kiracofe, John Melcher, Arvind Raman, Sudharsan Balasubramaniam, Steven Douglas Johnson, Shuiqing Hu

    A suite of dynamic AFM simulators for air/liquid/vacuum on soft or hard samples.


  2. Jun 06 2012

    Illinois AMC 2012 6th Advanced Materials Characterization Workshop

    This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will...


  3. BME 695L Special Lecture 4: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)

    02 Dec 2011 | Online Presentations | Contributor(s): Helen McNally

    Guest lecturer: Helen McNally


  4. Illinois 2011 NanoBiophotonics Summer School: Poster Day: Peng Huang

    29 Nov 2011 | Online Presentations | Contributor(s): Peng Huang, Nadia Jassim

    Local raster scanning of high speed imaging of polymers in atomic force microscopy.


  5. Janusz Strzelecki


  6. Vsevolod Kosulnikov


  7. Base Motion Calculations

    20 Jun 2011 | Tools | Contributor(s): Daniel Kiracofe

    Automates the calculations in the paper by Kiracofe and Raman, Nanotechnology, 2011


  8. Irene Revenko

    Irene Revenko is an application scientist for Asylum Research since 2002. Prior to Asylum she was director of the Life Sciences Department at Veeco. Dr. Revenko received two Ph.D.s from Claude...


  9. AFM Metrology of Cellulose Nanocrystals

    03 May 2011 | Online Presentations | Contributor(s): Robert J. Moon, Ryan Wagner

    This talk discusses the characterization of cellulose nanocrystals via atomic force microscopy.


  10. AFM Sample Preparation in Biology

    03 May 2011 | Online Presentations | Contributor(s): Irene Revenko

    All biological samples are different, the key is to start with established recipes for similar samples, then adapt the procedures for a different one. We'll present guidelines for choosing a...


  11. Asylum Research Atomic Force Microscopy (AFM) Workshop

    03 May 2011 | Workshops

    This workshop includes lectures and equipment/imaging demonstrations for both life science applications and electrical characterization of materials.


  12. Atomic Force Microscopy: Applications for Life Science Research

    03 May 2011 | Online Presentations | Contributor(s): Irene Revenko

    This presentation presents the principles of AFM and demonstrates the applications in Life Sciences. We will also discuss key points about the technology, and more particularly, the technical...


  13. Electronic Characterization of Materials Using Conductive AFM

    03 May 2011 | Online Presentations | Contributor(s): Amir Moshar

    Purdue University Discovery Park, Asylum Research


  14. Force Measurements in AFM

    03 May 2011 | Online Presentations | Contributor(s): Amir Moshar

    Purdue University Discovery Park, Asylum Research


  15. Introduction to Birck Scanning Probe Microscopy Center

    03 May 2011 | Online Presentations | Contributor(s): Xin Xu

    This presentation gives an introduction to the AFM facility and AFM related research being conducted in Birck nanotechnology center (BNC), and also some useful AFM resources.


  16. Frederic Sansoz


  17. ME 597 Lecture 22: Frequency Modulated AFM: Experimental Details

    14 Feb 2011 | Online Presentations | Contributor(s): Ron Reifenberger


  18. ME 597 Lecture 16: Dynamic Approach Curves in AM-AFM (VEDA Demo)

    24 Jan 2011 | Online Presentations | Contributor(s): John Melcher

    Guest lecturer: John Melcher. VEDA demonstration.


  19. ME 597 Lecture 20: Scanning Controls (VEDA Demo)

    13 Jan 2011 | Online Presentations | Contributor(s): Daniel Kiracofe

    Guest lecturer: Daniel Kiracofe. VEDA demonstration.


  20. ME 597 Homework 4: AM-AFM Scans and Basics of FM-AFM

    29 Dec 2010 | Teaching Materials | Contributor(s): Ron Reifenberger

    Problems: Setting the feedback parameters in AM-AFM scanning Factors Affecting Contrast in dAFM Topographic and Phase Images FM-AFM A dAFM “pocket guide”