Find information on common issues.
Ask questions and find answers from other users.
Suggest a new site feature or improvement.
Check on status of your tickets.
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
ME 597 Homework 4: AM-AFM Scans and Basics of FM-AFM
29 Dec 2010 | | Contributor(s):: Ron Reifenberger
Problems:Setting the feedback parameters in AM-AFM scanningFactors Affecting Contrast in dAFM Topographic and Phase ImagesFM-AFMA dAFM “pocket guide”
ME 597 Homework 3:
29 Dec 2010 | | Contributor(s):: Arvind Raman
Problems:Steady state vibration response far from sampleAttractive and repulsive regimes of oscillationPractical issuesTheory
ME 597 Lecture 17: Cantilever Eigenmodes, Equivalent Point Mass Oscillator, Analytical Approaches
ME 597 Lecture 25: AFM in Liquids I
20 Dec 2010 | | Contributor(s):: Arvind Raman
ME 597 Lecture 26: AFM in Liquids II
ME 597 Lecture 27: Other Emerging dAFM Techniques
ME 597A Lecture 7: Uncertainty Quantification in Experiments
16 Dec 2010 | | Contributor(s):: Arvind Raman
Guest Lecture Arvind Raman.
ME 597 Lecture 24: Using AFM to Measure Electrostatic Forces
07 Dec 2010 | | Contributor(s):: Ron Reifenberger
ME 597 Lecture 23: FM-AFM Selected Results and Achieving Atomic Resolution with AFM
ME 597 Lecture 21: Frequency Modulated AFM
22 Nov 2010 | | Contributor(s):: Ron Reifenberger
ME 597 Lecture 18b: Analytical Approaches - Peak Interaction Forces
17 Nov 2010 | | Contributor(s):: Arvind Raman
Peak Force During Tapping - not directly observable.
ME 597 Lecture 18a: Analytical Approaches
ME 597 Lecture 19: VEDA - Scanning Controls
11 Nov 2010 | | Contributor(s):: Arvind Raman
ME 597 Lecture 15: Dynamic Approach Curves
09 Nov 2010 | | Contributor(s):: Arvind Raman
ME 597 Lecture 14: Introduction to Dynamic AFM
04 Nov 2010 | | Contributor(s):: Arvind Raman
ME 597 Lecture 13: Virtual Environment for Dynamic AFM (VEDA)
04 Nov 2010 | | Contributor(s):: John Melcher
Guest lecturer: John Melcher. VEDA Demonstration; Overview of Capabilities; F-Z Curve Tool
ME 597 Lecture 12: Experimental Uncertainties in Extracting Material Properties from F-Z Curves
29 Oct 2010 | | Contributor(s):: Ryan Wagner, Arvind Raman
Guest lecturer: Ryan Wagner.
TiCN/TiNbCN Multilayer System with Enhanced Tribological Properties
20 Oct 2010 | | Contributor(s):: Pedro Antonio Prieto
Improvement in the mechanical properties of hard coatings such monolayer (TiN, CrN, AlCN, WC-Co, TiCN) , has been achieved using compositional gradient WC/C layer, or multilayered type [transition metal/transition carbide]n, [transition metal/transition nitride]n, [TiCN/ZrCN]n, among others....
ME 597 Lecture 18: Stiffness Callibration and Amplitude Modulated Scanning
20 Oct 2010 | | Contributor(s):: Arvind Raman
The raw recording for this lecture is all that is available.
ME 597 Teaching Materials: Homeworks (Fall 2010)
18 Oct 2010 | | Contributor(s):: Ron Reifenberger, Arvind Raman
Homework materials for the Fall 2010 teaching of ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy.