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Tags: atomic force microscopy

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

All Categories (61-80 of 231)

  1. ME 597 Lecture 6: Interaction Forces II

    16 Sep 2010 | Online Presentations

    http://nanohub.org/resources/9715

  2. ME 597 Lecture 5: Interaction Forces I

    14 Sep 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    See reading references below. Related Reading: J. Israelachvilli, “Intermolecular and surface forces,” Elsevier Science, 2010, 3rd ed. H. J.Butt,B. Cappella, M. Kappl, “Force measurements with...

    http://nanohub.org/resources/9713

  3. ME 597 Lecture 4: The Transition from STM to AFM

    09 Sep 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    Recommended Reading: See References below. G. Binnig, C. Quate and Ch. Gerber, Atomic Force Microscope,

    http://nanohub.org/resources/9685

  4. ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2010)

    01 Sep 2010 | Courses | Contributor(s): Ron Reifenberger, Arvind Raman

    Fall 2010 A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

    http://nanohub.org/resources/9598

  5. ME 597 Course Overview

    01 Sep 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    http://nanohub.org/resources/9599

  6. ECET 499N Lecture 12: Scanning Probe Microscopy Applications (in Neuroscience and Beyond)

    12 Apr 2010 | Online Presentations | Contributor(s): Helen McNally

    http://nanohub.org/resources/8837

  7. ME 597 Lecture 14: Cantilever Eigenmodes

    08 Apr 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/7713

  8. ME 597 Lecture 8: Interaction Forces II

    08 Mar 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/7699

  9. ME 597 Lecture 10: Force Distance Curves II

    17 Feb 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/7701

  10. ME 597 Lecture 27b: Recent Advances in AFM

    16 Feb 2010 | Online Presentations | Contributor(s): Arvind Raman

    Topics: Multi-Frequency AFM Using Tuned Cantilevers Momentary Excitation Please note: the slides for this lecture were accidentally lost and a scanned copy of the slide handouts is used. ...

    http://nanohub.org/resources/8476

  11. ME 597 Lecture 9: Force Distance Curves I

    10 Feb 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/7700

  12. ME 597 Lecture 7: Interaction Forces I

    08 Feb 2010 | Online Presentations | Contributor(s): Arvind Raman

    From interatomic and intermolecular forces to tip-sample interaction forces. Related Reading: J. Israelachvilli, “Intermolecular and surface forces,” Elsevier Science, 2010, 3rd ed. H....

    http://nanohub.org/resources/7698

  13. ME 597 Lecture 22: Frequency Modulated AFM - Experimental Details

    02 Feb 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    http://nanohub.org/resources/7987

  14. ME 597 Lecture 21: Frequency Modulated AFM

    02 Feb 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    http://nanohub.org/resources/7986

  15. ME 597 Lecture 20: Imaging Artifacts in AM-AFM

    27 Jan 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    Topics: Probe Tip Artifacts Instrumental Artifacts Large Force Artifacts Image Processing Artifacts Intrinsic Limitations Tip Cleaning Reading: Paul West, Natalia Starostina, AFM...

    http://nanohub.org/resources/7985

  16. Illinois ME 498 Introduction of Nano Science and Technology, Lecture 20: Sensing and Actuation in Nanoscale

    17 Dec 2009 | Online Presentations | Contributor(s): Nick Fang, Omar N Sobh

    Sensing and Actuation in Nanoscale Topics: Scanning Tunneling Microscopy Two Modes of Forming STM Images STM Manipulation Atomic Force Microscopy Typical Engaging Curve Imaging in...

    http://nanohub.org/resources/8028

  17. ME 597 Lecture 27a: Recent Advances in AFM

    14 Dec 2009 | Online Presentations | Contributor(s): Ron Reifenberger

    Topics: Unifying Theme Taking advantage of cantilever modes

    http://nanohub.org/resources/7971

  18. ME 597 Lecture 23: FM-AFM Selected Results

    08 Dec 2009 | Online Presentations | Contributor(s): Ron Reifenberger

    Topics: FM-AFM Selected Results/li> Achieving Atomic Resolution with AFM

    http://nanohub.org/resources/7977

  19. ME 597 Lecture 28: Other Emerging dAFM Techniques

    08 Dec 2009 | Online Presentations | Contributor(s): Arvind Raman

    Topics: Multi-frequency AFM Sub-surface imaging High-speed/video rate AFM

    http://nanohub.org/resources/7972

  20. ME 597 Lecture 25: Using the AFM to Measure Electrostatic Forces

    02 Dec 2009 | Online Presentations | Contributor(s): Ron Reifenberger

    http://nanohub.org/resources/7928

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