Tags: atomic force microscopy (AFM)

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Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

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  1. Electronic Characterization of Materials Using Conductive AFM

    03 May 2011 | | Contributor(s):: Amir Moshar

  2. Force Measurements in AFM

    03 May 2011 | | Contributor(s):: Amir Moshar

  3. Introduction to Birck Scanning Probe Microscopy Center

    03 May 2011 | | Contributor(s):: Xin Xu

    This presentation gives an introduction to the AFM facility and AFM related research being conducted in Birck nanotechnology center (BNC), and also some useful AFM resources.

  4. Frederic Sansoz

    https://nanohub.org/members/52609

  5. ME 597 Lecture 22: Frequency Modulated AFM: Experimental Details

    14 Feb 2011 | | Contributor(s):: Ron Reifenberger

  6. ME 597 Lecture 16: Dynamic Approach Curves in AM-AFM (VEDA Demo)

    24 Jan 2011 | | Contributor(s):: John Melcher

    Guest lecturer: John Melcher. VEDA demonstration.

  7. ME 597 Lecture 20: Scanning Controls (VEDA Demo)

    13 Jan 2011 | | Contributor(s):: Daniel Kiracofe

    Guest lecturer: Daniel Kiracofe. VEDA demonstration.

  8. MOLpull: A tool for molecular free energy reconstruction along a pulling coordinate

    24 Aug 2010 | | Contributor(s):: Lisa Felberg, Ignacio Franco, Martin McCullagh, Mark Ratner, George C. Schatz, Marcelo Carignano

    Estimates the force required for stretching a molecule and determines the potential of mean force along the extension coordinate.

  9. ME 597 Homework 4: AM-AFM Scans and Basics of FM-AFM

    29 Dec 2010 | | Contributor(s):: Ron Reifenberger

    Problems:Setting the feedback parameters in AM-AFM scanningFactors Affecting Contrast in dAFM Topographic and Phase ImagesFM-AFMA dAFM “pocket guide”

  10. ME 597 Homework 3:

    29 Dec 2010 | | Contributor(s):: Arvind Raman

    Problems:Steady state vibration response far from sampleAttractive and repulsive regimes of oscillationPractical issuesTheory

  11. ME 597 Lecture 17: Cantilever Eigenmodes, Equivalent Point Mass Oscillator, Analytical Approaches

    04 Nov 2010 | | Contributor(s):: Arvind Raman

  12. ME 597 Lecture 25: AFM in Liquids I

    07 Dec 2010 | | Contributor(s):: Arvind Raman

  13. ME 597 Lecture 26: AFM in Liquids II

    07 Dec 2010 | | Contributor(s):: Arvind Raman

  14. ME 597 Lecture 27: Other Emerging dAFM Techniques

    07 Dec 2010 | | Contributor(s):: Arvind Raman

  15. ME 597A Lecture 7: Uncertainty Quantification in Experiments

    18 Nov 2010 | | Contributor(s):: Arvind Raman

    Guest Lecture Arvind Raman.

  16. ME 597 Lecture 24: Using AFM to Measure Electrostatic Forces

    22 Nov 2010 | | Contributor(s):: Ron Reifenberger

  17. ME 597 Lecture 23: FM-AFM Selected Results and Achieving Atomic Resolution with AFM

    22 Nov 2010 | | Contributor(s):: Ron Reifenberger

  18. ME 597 Lecture 21: Frequency Modulated AFM

    22 Nov 2010 | | Contributor(s):: Ron Reifenberger

  19. ME 597 Lecture 18b: Analytical Approaches - Peak Interaction Forces

    17 Nov 2010 | | Contributor(s):: Arvind Raman

    Peak Force During Tapping - not directly observable.

  20. ME 597 Lecture 18a: Analytical Approaches

    04 Nov 2010 | | Contributor(s):: Arvind Raman