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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
AFM imaging of bare silicon surface to measure its rms roughness
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my question is related to AFM imaging of silicon surface.
after doing phase (AC mode) imaging of silicon surface. i found the roughness of bare silicon surface is ~ 50 nm....
Images for AFM
17 Feb 2009 | Presentation Materials | Contributor(s): yan zhang
VEDA 2.0 (Virtual Environment for Dynamic AFM)
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03 Feb 2009 | Tools | Contributor(s): John Melcher, Daniel Kiracofe, Shuiqing Hu, Arvind Raman
There is a new version of this tool which can be found here. Please use that tool instead
Gas Damping of Microcantilevers at Low Ambient Pressures
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03 Nov 2008 | Online Presentations | Contributor(s): Rahul Anil Bidkar
This seminar will present a theoretical model for predicting the gas damping of long, rectangular silicon
microcantilevers, which are oscillating in an unbounded gaseous medium with the ambient...
SUGARCube - Cantilever
03 Oct 2008 | Tools | Contributor(s): Fengyuan Li, Brandon Patterson, Jason Clark, yi zeng
Cantilever modeling and simulation with different loads
So What do Biologist, Biotechnologists & Pharmaceutical Scientist Want With an AFM/SPM Anyway?
11 Sep 2008 | Online Presentations | Contributor(s): Kunal Bose
BNC Research Review: Carbon Nanotubes as Nucleic Acid Carriers
04 Jun 2008 | Online Presentations | Contributor(s): Don Bergstrom
This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the...
SPMW Scanning Probe Acceleration Microscopy: Towards Real Time Reconstruction of Tip-Sample Forces in Tapping Mode AFM
09 Jan 2008 | Online Presentations | Contributor(s): Tomasz Kowalewski
Tapping mode atomic force microscopy (TMAFM) in fluids has become an increasingly important technique, especially in studying biological samples under near physiological conditions. However,...
SPMW Single molecule recognition atomic force microscopy
08 Jan 2008 | Online Presentations | Contributor(s): Peter Hinterdorfer
In molecular recognition force microscopy (MRFM), ligands are covalently attached to atomic force microscopy tips for the molecular recognition of their cognitive receptors on probe surfaces. A...
BME 695N Lecture 9: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)
30 Sep 2007 | Online Presentations | Contributor(s): Helen McNally
What Helen McNally as guest lecturer.
Introduction to VEDA: Virtual Environment for Dynamic AFM
26 Sep 2007 | Teaching Materials | Contributor(s): Arvind Raman
This resource has become outdated and has been retired by agreement with the author. Please see the VEDA tool page and supporting documents for current information regarding the VEDA Tool. This...
Oligodeoxyribonucleotide Association with Single-Walled Carbon Nanotubes
06 Aug 2007 | Online Presentations | Contributor(s): Jennifer McDonald
Commercially available single-walled carbon nanotubes (SWCNTs) tend to aggregate as ropes and bundles during production making them of little use in many scientific and industrial applications. An...
Re-engineering a Healthy Eye Tissue to Restore Damaged Eyesight
06 Aug 2007 | Online Presentations | Contributor(s): Margarita Shalaev
Age-related macular degeneration (AMD) is an eye disease that is the leading cause of blindness in the USA and Western Europe. It affects over one million people in the United States alone. One of...
SPMW A fresh look to amplitude-modulation AFM: Force minimization, interaction measurement, and the quest for high resolution
03 Jul 2007 | Online Presentations | Contributor(s): Udo D. Schwarz
Frequency modulation atomic force microscopy (FM-AFM) has been able to deliver high-resolution atomic-scale images in ultrahigh vacuum for over one decade. In addition, there have been recent...
SPMW AFM at Video Rate and Beyond
16 May 2007 | Online Presentations | Contributor(s): Mervyn Miles
The particular advantages that atomic force microscopy (AFM) has over other types of microscopy are well-known, but it has the one major disadvantage of low imaging rates in conventional...
SPMW The Nanomechanics of compositional mapping in amplitude modulation AFM
11 May 2007 | Online Presentations | Contributor(s): Ricardo Garcia
Amplitude modulation atomic force microscopy (AM-AFM) has been very successful for imaging with high spatial resolution inorganic as well as soft materials such as polymers, living cells and...
BNC Annual Research Symposium: Metrology and Nanomaterials Characterization
10 May 2007 | Online Presentations | Contributor(s): Ron Reifenberger
SPMW FIRAT: A fast and sensitive probe structure for SPM
08 May 2007 | Online Presentations | Contributor(s): F. Levent Degertekin
A new SPM probe, called the force sensing integrated readout and active tip (FIRAT), is described and initial experimental results obtained on commercial AFM systems are presented. FIRAT combines...
VEDA: Dynamic Approach Curves
15 Mar 2007 | Tools | Contributor(s): John Melcher, Shuiqing Hu, Steven Douglas Johnson, Daniel Kiracofe, Arvind Raman
This tool is being replaced by VEDA 2.0. Use that tool instead.
Toward Improving the Precision of Nanoscale Force-Displacement Measurements
13 Mar 2007 | Online Presentations | Contributor(s): Jason Clark
Nanotechnology has great potential for being used to create
better medicines, materials, and sensors. With increasing
interest in nanotechnology to improve the quality of our