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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
Frontiers in Scanning Probe Microscopy
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30 Nov 2006 |
From October 4- 6, 2006 the Birck Nanotechnology Center at Purdue University hosted a three day focused workshop on cutting edge SPM techniques that are under development throughout the world.The three day workshop featured thematically arranged invited talks. The workshop themes are broadly...
SPMW Interplay between theory and experiment in AFM nanomechanical studies of polymers
30 Nov 2006 | | Contributor(s):: ,
High-resolution imaging of surfaces and compositional mapping of heterogeneous materials are the main functions of atomic force microscopy (AFM) in studies of polymer materials. Compositional mapping is mostly based on differences of mechanical properties of the sample components yet...
SPMW Nanotube, nanoneedle and nanomeniscus: mechanical and wetting properties of modified AFM tip apex
12 Dec 2006 |
Among AFM microscopes, Dynamic force microscopes (DFM) are very sensitive to variation of minute forces involved in the interaction between the tip and the surface. However, despite numerous efforts, imaging and probing mechanical properties of soft materials in air and water at the nm scale are...
SPMW Nanomechanics: from nanotechnology to biology
The development of new materials with size of few nanometers has opened a new field of scientific and technological research. The goal is to develop faster and better communication systems and transports, as well as smarter and smaller nanodevices for biomedical applications. To reach these...
SPMW Nonlinear dynamics in AFM - chaos and parametric resonance
05 Jan 2007 | | Contributor(s):: Arvind Raman
The field of nonlinear dynamics deals with mathematical techniques to study the nonlinear equations that serve as models of physical systems. The benefits of using nonlinear dynamics concepts to interpret and predict probe oscillations in dynamic AFM  are becoming increasingly clear....
SPMW Mechanisms of atomic friction studied by friction force microscopy
12 Dec 2006 | | Contributor(s):: Meyer
Force microscopy is a versatile instrument to investigate physical phenomena on surfaces. The first emphasis is on the study of friction on the nanometer-scale, also called nanotribology. It will be shown that atomic-scale stick-slip is relatively well understood, where the dependence on...
Atomic Force Microscopy
01 Dec 2005 | | Contributor(s):: Arvind Raman
Atomic Force Microscopy (AFM) is an indispensible tool in nano science for the fabrication, metrology, manipulation, and property characterization of nanostructures. This tutorial reviews some of the physics of the interaction forces between the nanoscale tip and sample, the dynamics of the...
Determining the Mechanics of Living Cells by Atomic Force Microscopy
21 Apr 2004 | | Contributor(s):: Emilie Grzywa Rexeisen
2003 SURI Conference Proceedings