Support

Support Options

Submit a Support Ticket

 

Tags: atomic force microscopy

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

All Categories (21-40 of 232)

  1. Base Motion Calculations

    17 Jun 2011 | Tools | Contributor(s): Daniel Kiracofe

    Automates the calculations in the paper by Kiracofe and Raman, Nanotechnology, 2011

    http://nanohub.org/resources/abase

  2. Irene Revenko

    Irene Revenko is an application scientist for Asylum Research since 2002. Prior to Asylum she was director of the Life Sciences Department at Veeco. Dr. Revenko received two Ph.D.s from Claude...

    http://nanohub.org/members/54763

  3. AFM Metrology of Cellulose Nanocrystals

    03 May 2011 | Online Presentations | Contributor(s): Robert J. Moon, Ryan Wagner

    This talk discusses the characterization of cellulose nanocrystals via atomic force microscopy.

    http://nanohub.org/resources/11019

  4. AFM Sample Preparation in Biology

    03 May 2011 | Online Presentations | Contributor(s): Irene Revenko

    All biological samples are different, the key is to start with established recipes for similar samples, then adapt the procedures for a different one. We'll present guidelines for choosing a...

    http://nanohub.org/resources/11026

  5. Asylum Research Atomic Force Microscopy (AFM) Workshop

    03 May 2011 | Workshops

    This workshop includes lectures and equipment/imaging demonstrations for both life science applications and electrical characterization of materials.

    http://nanohub.org/resources/11016

  6. Atomic Force Microscopy: Applications for Life Science Research

    03 May 2011 | Online Presentations | Contributor(s): Irene Revenko

    This presentation presents the principles of AFM and demonstrates the applications in Life Sciences. We will also discuss key points about the technology, and more particularly, the technical...

    http://nanohub.org/resources/11017

  7. Electronic Characterization of Materials Using Conductive AFM

    03 May 2011 | Online Presentations | Contributor(s): Amir Moshar

    Purdue University Discovery Park, Asylum Research

    http://nanohub.org/resources/11020

  8. Force Measurements in AFM

    03 May 2011 | Online Presentations | Contributor(s): Amir Moshar

    Purdue University Discovery Park, Asylum Research

    http://nanohub.org/resources/11018

  9. Introduction to Birck Scanning Probe Microscopy Center

    03 May 2011 | Online Presentations | Contributor(s): Xin Xu

    This presentation gives an introduction to the AFM facility and AFM related research being conducted in Birck nanotechnology center (BNC), and also some useful AFM resources.

    http://nanohub.org/resources/11015

  10. Frederic Sansoz

    http://nanohub.org/members/52609

  11. ME 597 Lecture 22: Frequency Modulated AFM: Experimental Details

    14 Feb 2011 | Online Presentations | Contributor(s): Ron Reifenberger

    http://nanohub.org/resources/10062

  12. ME 597 Lecture 16: Dynamic Approach Curves in AM-AFM (VEDA Demo)

    24 Jan 2011 | Online Presentations | Contributor(s): John Melcher

    Guest lecturer: John Melcher. VEDA demonstration.

    http://nanohub.org/resources/9960

  13. ME 597 Lecture 20: Scanning Controls (VEDA Demo)

    13 Jan 2011 | Online Presentations | Contributor(s): Daniel Kiracofe

    Guest lecturer: Daniel Kiracofe. VEDA demonstration.

    http://nanohub.org/resources/10060

  14. ME 597 Homework 4: AM-AFM Scans and Basics of FM-AFM

    29 Dec 2010 | Teaching Materials | Contributor(s): Ron Reifenberger

    Problems: Setting the feedback parameters in AM-AFM scanning Factors Affecting Contrast in dAFM Topographic and Phase Images FM-AFM A dAFM “pocket guide”

    http://nanohub.org/resources/10241

  15. ME 597 Homework 3:

    29 Dec 2010 | Teaching Materials | Contributor(s): Arvind Raman

    Problems: Steady state vibration response far from sample Attractive and repulsive regimes of oscillation Practical issues Theory

    http://nanohub.org/resources/10239

  16. ME 597 Lecture 17: Cantilever Eigenmodes, Equivalent Point Mass Oscillator, Analytical Approaches

    29 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/9961

  17. ME 597 Lecture 25: AFM in Liquids I

    20 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/10149

  18. ME 597 Lecture 26: AFM in Liquids II

    20 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/10150

  19. ME 597 Lecture 27: Other Emerging dAFM Techniques

    20 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/10151

  20. Uncertainty Quantification in Experiments

    16 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

    An overview is provided of how experimental data should be reported with true uncertainties. Examples from experiments on gas damping measurements in RF switches and for estimation of...

    http://nanohub.org/resources/10035

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.