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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
VEDA: Virtual Environment for Dynamic AFM
30 May 2012 | | Contributor(s):: Daniel Kiracofe, John Melcher, Arvind Raman, Sudharsan Balasubramaniam, Steven Douglas Johnson, Shuiqing Hu
A suite of dynamic AFM simulators for air/liquid/vacuum on soft or hard samples.
Jun 06 2012
Illinois AMC 2012 6th Advanced Materials Characterization Workshop
BME 695L Special Lecture 4: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)
02 Dec 2011 | | Contributor(s):: Helen McNally
Guest lecturer: Helen McNally
Illinois 2011 NanoBiophotonics Summer School: Poster Day: Peng Huang
17 Nov 2011 | | Contributor(s):: Peng Huang, Nadia Jassim
Local raster scanning of high speed imaging of polymers in atomic force microscopy.
Base Motion Calculations
17 Jun 2011 | | Contributor(s):: Daniel Kiracofe
Automates the calculations in the paper by Kiracofe and Raman, Nanotechnology, 2011
AFM Metrology of Cellulose Nanocrystals
21 Mar 2011 | | Contributor(s):: Robert J. Moon, Ryan Wagner
This talk discusses the characterization of cellulose nanocrystals via atomic force microscopy.
AFM Sample Preparation in Biology
22 Mar 2011 | | Contributor(s):: Irene Revenko
All biological samples are different, the key is to start with established recipes for similar samples, then adapt the procedures for a different one. We'll present guidelines for choosing a substrate, immobilizing the sample, choosing the proper cantilever, as well as tips and tricks optimize...
Asylum Research Atomic Force Microscopy (AFM) Workshop
21 Mar 2011 |
This workshop includes lectures and equipment/imaging demonstrations for both life science applications and electrical characterization of materials.
Atomic Force Microscopy: Applications for Life Science Research
21 Mar 2011 | | Contributor(s):: Irene Revenko
This presentation presents the principles of AFM and demonstrates the applications in Life Sciences. We will also discuss key points about the technology, and more particularly, the technical characteristics you should understand when using an AFM such as noise level, limitations of the...
Electronic Characterization of Materials Using Conductive AFM
21 Mar 2011 | | Contributor(s):: Amir Moshar
Force Measurements in AFM
Introduction to Birck Scanning Probe Microscopy Center
21 Mar 2011 | | Contributor(s):: Xin Xu
This presentation gives an introduction to the AFM facility and AFM related research being conducted in Birck nanotechnology center (BNC), and also some useful AFM resources.
ME 597 Lecture 22: Frequency Modulated AFM: Experimental Details
22 Nov 2010 | | Contributor(s):: Ron Reifenberger
ME 597 Lecture 16: Dynamic Approach Curves in AM-AFM (VEDA Demo)
04 Nov 2010 | | Contributor(s):: John Melcher
Guest lecturer: John Melcher. VEDA demonstration.
ME 597 Lecture 20: Scanning Controls (VEDA Demo)
22 Nov 2010 | | Contributor(s):: Daniel Kiracofe
Guest lecturer: Daniel Kiracofe. VEDA demonstration.
ME 597 Homework 4: AM-AFM Scans and Basics of FM-AFM
29 Dec 2010 | | Contributor(s):: Ron Reifenberger
Problems:Setting the feedback parameters in AM-AFM scanningFactors Affecting Contrast in dAFM Topographic and Phase ImagesFM-AFMA dAFM “pocket guide”