Tags: atomic force microscopy

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

All Categories (21-40 of 128)

  1. VEDA: Virtual Environment for Dynamic AFM

    30 May 2012 | | Contributor(s):: Daniel Kiracofe, John Melcher, Arvind Raman, Sudharsan Balasubramaniam, Steven Douglas Johnson, Shuiqing Hu

    A suite of dynamic AFM simulators for air/liquid/vacuum on soft or hard samples.

  2. Jun 06 2012

    Illinois AMC 2012 6th Advanced Materials Characterization Workshop

    This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will...

    http://nanohub.org/events/details/350

  3. BME 695L Special Lecture 4: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)

    02 Dec 2011 | | Contributor(s):: Helen McNally

    Guest lecturer: Helen McNally

  4. Illinois 2011 NanoBiophotonics Summer School: Poster Day: Peng Huang

    17 Nov 2011 | | Contributor(s):: Peng Huang, Nadia Jassim

    Local raster scanning of high speed imaging of polymers in atomic force microscopy.

  5. Janusz Strzelecki

    http://nanohub.org/members/60630

  6. Vsevolod Kosulnikov

    http://nanohub.org/members/56242

  7. Base Motion Calculations

    17 Jun 2011 | | Contributor(s):: Daniel Kiracofe

    Automates the calculations in the paper by Kiracofe and Raman, Nanotechnology, 2011

  8. Irene Revenko

    Irene Revenko is an application scientist for Asylum Research since 2002. Prior to Asylum she was director of the Life Sciences Department at Veeco. Dr. Revenko received two Ph.D.s from Claude...

    http://nanohub.org/members/54763

  9. AFM Metrology of Cellulose Nanocrystals

    21 Mar 2011 | | Contributor(s):: Robert J. Moon, Ryan Wagner

    This talk discusses the characterization of cellulose nanocrystals via atomic force microscopy.

  10. AFM Sample Preparation in Biology

    22 Mar 2011 | | Contributor(s):: Irene Revenko

    All biological samples are different, the key is to start with established recipes for similar samples, then adapt the procedures for a different one. We'll present guidelines for choosing a substrate, immobilizing the sample, choosing the proper cantilever, as well as tips and tricks optimize...

  11. Asylum Research Atomic Force Microscopy (AFM) Workshop

    21 Mar 2011 |

    This workshop includes lectures and equipment/imaging demonstrations for both life science applications and electrical characterization of materials.

  12. Atomic Force Microscopy: Applications for Life Science Research

    21 Mar 2011 | | Contributor(s):: Irene Revenko

    This presentation presents the principles of AFM and demonstrates the applications in Life Sciences. We will also discuss key points about the technology, and more particularly, the technical characteristics you should understand when using an AFM such as noise level, limitations of the...

  13. Electronic Characterization of Materials Using Conductive AFM

    21 Mar 2011 | | Contributor(s):: Amir Moshar

  14. Force Measurements in AFM

    21 Mar 2011 | | Contributor(s):: Amir Moshar

  15. Introduction to Birck Scanning Probe Microscopy Center

    21 Mar 2011 | | Contributor(s):: Xin Xu

    This presentation gives an introduction to the AFM facility and AFM related research being conducted in Birck nanotechnology center (BNC), and also some useful AFM resources.

  16. Frederic Sansoz

    http://nanohub.org/members/52609

  17. ME 597 Lecture 22: Frequency Modulated AFM: Experimental Details

    22 Nov 2010 | | Contributor(s):: Ron Reifenberger

  18. ME 597 Lecture 16: Dynamic Approach Curves in AM-AFM (VEDA Demo)

    04 Nov 2010 | | Contributor(s):: John Melcher

    Guest lecturer: John Melcher. VEDA demonstration.

  19. ME 597 Lecture 20: Scanning Controls (VEDA Demo)

    22 Nov 2010 | | Contributor(s):: Daniel Kiracofe

    Guest lecturer: Daniel Kiracofe. VEDA demonstration.

  20. ME 597 Homework 4: AM-AFM Scans and Basics of FM-AFM

    29 Dec 2010 | | Contributor(s):: Ron Reifenberger

    Problems:Setting the feedback parameters in AM-AFM scanningFactors Affecting Contrast in dAFM Topographic and Phase ImagesFM-AFMA dAFM “pocket guide”