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Tags: atomic force microscopy

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

All Categories (81-100 of 232)

  1. ME 597 Lecture 25: Using the AFM to Measure Electrostatic Forces

    02 Dec 2009 | Online Presentations | Contributor(s): Ron Reifenberger

    http://nanohub.org/resources/7928

  2. ME 597 Lecture 17: Imaging or Peak Forces in Tapping Mode AFM

    01 Nov 2009 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/7720

  3. ME 597 Lecture 16: Analytical Descriptions of AM-AFM, Theory of Phase Contrast

    01 Nov 2009 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/7715

  4. ME 597 Lecture 13: Point Mass Models, Modeling AM-AFM

    01 Nov 2009 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/7708

  5. ME 597 Lecture 12: Introduction to Dynamic AFM – Point Mass Approximation

    01 Nov 2009 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/7703

  6. ME 597 Lecture 6: The Transition from STM to AFM

    26 Oct 2009 | Online Presentations | Contributor(s): Ron Reifenberger

    G. Binnig, C. Quate and Ch. Gerber, “Atomic Force Microscope”, Phys. Rev. Lett. 56, 930 (1986).

    http://nanohub.org/resources/7622

  7. VEDA: Amplitude Modulated Scanning

    20 Oct 2009 | Tools | Contributor(s): John Melcher, Shuiqing Hu, Arvind Raman, Steven Douglas Johnson, Daniel Kiracofe

    This tool is being replaced by VEDA 2.0. Use that tool instead.

    http://nanohub.org/resources/vedaams

  8. Katie M Smith

    http://nanohub.org/members/38245

  9. ME 597 Lecture 2: Electron States in Solids-Density of States

    09 Sep 2009 | Online Presentations | Contributor(s): Ron Reifenberger

    Note: This lecture has been revised since its original presentation. Topics: Electron States in Solids – Bloch Functions Kronig-Penney Model Density of States

    http://nanohub.org/resources/7343

  10. ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2009)

    03 Sep 2009 | Courses | Contributor(s): Ron Reifenberger, Arvind Raman

    A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

    http://nanohub.org/resources/7320

  11. ME 597 Lecture 1: Introduction to Basic Quantum Mechanics

    01 Sep 2009 | Online Presentations | Contributor(s): Ron Reifenberger

    Note: This lecture has been revised since its original presentation. Topics: Introduction to Basic Quantum Mechanics Energy States in Periodic Crystals Course is dual listed as...

    http://nanohub.org/resources/7321

  12. ME 597 Introductory Lecture

    01 Sep 2009 | Online Presentations | Contributor(s): Ron Reifenberger

    Course is dual listed as Physics 570.

    http://nanohub.org/resources/7322

  13. Nanotribology, Nanomechanics and Materials Characterization Studies

    08 Jun 2009 | Online Presentations | Contributor(s): Bharat Bhushan

    Fundamental nanotribological studies provide insight to molecular origins of interfacial phenomena including adhesion, friction, wear and lubrication. Friction and wear of lightly loaded...

    http://nanohub.org/resources/6573

  14. ECET 499N: Introduction to Nanotechnology

    30 Mar 2009 | Courses | Contributor(s): Helen McNally

    An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical...

    http://nanohub.org/resources/6583

  15. AFM imaging of bare silicon surface to measure its rms roughness

    Open | Responses: 1

    Dear Friends,

    my question is related to AFM imaging of silicon surface. after doing phase (AC mode) imaging of silicon surface. i found the roughness of bare silicon surface is ~ 50 nm....

    http://nanohub.org/answers/question/242

  16. Images for AFM

    17 Feb 2009 | Presentation Materials | Contributor(s): yan zhang

    http://nanohub.org/resources/6275

  17. VEDA 2.0 (Virtual Environment for Dynamic AFM)

    28 Aug 2008 | Tools | Contributor(s): John Melcher, Daniel Kiracofe, Shuiqing Hu, Arvind Raman

    There is a new version of this tool which can be found here. Please use that tool instead

    http://nanohub.org/resources/adac

  18. Gas Damping of Microcantilevers at Low Ambient Pressures

    03 Nov 2008 | Online Presentations | Contributor(s): Rahul Anil Bidkar

    This seminar will present a theoretical model for predicting the gas damping of long, rectangular silicon microcantilevers, which are oscillating in an unbounded gaseous medium with the ambient...

    http://nanohub.org/resources/5683

  19. SUGARCube - Cantilever

    01 May 2008 | Tools | Contributor(s): Fengyuan Li, Brandon Patterson, Jason Clark, yi zeng

    Cantilever modeling and simulation with different loads

    http://nanohub.org/resources/sugar

  20. So What do Biologist, Biotechnologists & Pharmaceutical Scientist Want With an AFM/SPM Anyway?

    11 Sep 2008 | Online Presentations | Contributor(s): Kunal Bose

    http://nanohub.org/resources/4818

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