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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
ME 597 Lecture 21: Frequency Modulated AFM
02 Feb 2010 | | Contributor(s):: Ron Reifenberger
ME 597 Lecture 20: Imaging Artifacts in AM-AFM
27 Jan 2010 | | Contributor(s):: Ron Reifenberger
Topics:Probe Tip ArtifactsInstrumental ArtifactsLarge Force ArtifactsImage Processing ArtifactsIntrinsic LimitationsTip Cleaning
Illinois ME 498 Introduction of Nano Science and Technology, Lecture 20: Sensing and Actuation in Nanoscale
17 Dec 2009 | | Contributor(s):: Nick Fang, Omar N Sobh
Sensing and Actuation in NanoscaleTopics: Scanning Tunneling Microscopy Two Modes of Forming STM Images STM Manipulation Atomic Force Microscopy Typical Engaging Curve Imaging in Fluid Shear Force Sensing by Tuning Fork Tip Shape Effects: Containment Tip Shape Effect: Cone Angle Other Imaging...
ME 597 Lecture 27a: Recent Advances in AFM
14 Dec 2009 | | Contributor(s):: Ron Reifenberger
Topics:Unifying ThemeTaking advantage of cantilever modes
ME 597 Lecture 23: FM-AFM Selected Results
08 Dec 2009 | | Contributor(s):: Ron Reifenberger
Topics:FM-AFM Selected Results/li>Achieving Atomic Resolution with AFM
ME 597 Lecture 28: Other Emerging dAFM Techniques
08 Dec 2009 | | Contributor(s):: Arvind Raman
Topics:Multi-frequency AFMSub-surface imagingHigh-speed/video rate AFM
ME 597 Lecture 25: Using the AFM to Measure Electrostatic Forces
02 Dec 2009 | | Contributor(s):: Ron Reifenberger
ME 597 Lecture 17: Imaging or Peak Forces in Tapping Mode AFM
01 Nov 2009 | | Contributor(s):: Arvind Raman
ME 597 Lecture 16: Analytical Descriptions of AM-AFM, Theory of Phase Contrast
ME 597 Lecture 13: Point Mass Models, Modeling AM-AFM
ME 597 Lecture 12: Introduction to Dynamic AFM – Point Mass Approximation
ME 597 Lecture 6: The Transition from STM to AFM
26 Oct 2009 | | Contributor(s):: Ron Reifenberger
VEDA: Amplitude Modulated Scanning
20 Oct 2009 | | Contributor(s):: John Melcher, Shuiqing Hu, Arvind Raman, Steven Douglas Johnson, Daniel Kiracofe
This tool is being replaced by VEDA 2.0. Use that tool instead.
Katie M Smith
ME 597 Lecture 2: Electron States in Solids-Density of States
09 Sep 2009 | | Contributor(s):: Ron Reifenberger
Note: This lecture has been revised since its original presentation.Topics:Electron States in Solids – Bloch FunctionsKronig-Penney ModelDensity of States
ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2009)
03 Sep 2009 | | Contributor(s):: Ron Reifenberger, Arvind Raman
A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.
ME 597 Lecture 1: Introduction to Basic Quantum Mechanics
01 Sep 2009 | | Contributor(s):: Ron Reifenberger
Note: This lecture has been revised since its original presentation.Topics:Introduction to Basic Quantum MechanicsEnergy States in Periodic Crystals
ME 597 Introductory Lecture
Nanotribology, Nanomechanics and Materials Characterization Studies
08 Jun 2009 | | Contributor(s):: Bharat Bhushan
Fundamental nanotribological studies provide insight to molecular origins of interfacial phenomena including adhesion, friction, wear and lubrication. Friction and wear of lightly loaded micro/nano components are highly dependent on the surface interactions (few atomic layers). Nanotribological...
ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | | Contributor(s):: Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...