Tags: atomic force microscopy

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

All Categories (81-100 of 127)

  1. ME 597 Lecture 20: Imaging Artifacts in AM-AFM

    27 Jan 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    Topics: Probe Tip Artifacts Instrumental Artifacts Large Force Artifacts Image Processing Artifacts Intrinsic Limitations Tip Cleaning Reading: Paul West, Natalia Starostina, AFM...

    http://nanohub.org/resources/7985

  2. Illinois ME 498 Introduction of Nano Science and Technology, Lecture 20: Sensing and Actuation in Nanoscale

    17 Dec 2009 | Online Presentations | Contributor(s): Nick Fang, Omar N Sobh

    Sensing and Actuation in Nanoscale Topics: Scanning Tunneling Microscopy Two Modes of Forming STM Images STM Manipulation Atomic Force Microscopy Typical Engaging Curve Imaging in...

    http://nanohub.org/resources/8028

  3. ME 597 Lecture 27a: Recent Advances in AFM

    14 Dec 2009 | Online Presentations | Contributor(s): Ron Reifenberger

    Topics: Unifying Theme Taking advantage of cantilever modes

    http://nanohub.org/resources/7971

  4. ME 597 Lecture 23: FM-AFM Selected Results

    08 Dec 2009 | Online Presentations | Contributor(s): Ron Reifenberger

    Topics: FM-AFM Selected Results/li> Achieving Atomic Resolution with AFM

    http://nanohub.org/resources/7977

  5. ME 597 Lecture 28: Other Emerging dAFM Techniques

    08 Dec 2009 | Online Presentations | Contributor(s): Arvind Raman

    Topics: Multi-frequency AFM Sub-surface imaging High-speed/video rate AFM

    http://nanohub.org/resources/7972

  6. ME 597 Lecture 25: Using the AFM to Measure Electrostatic Forces

    02 Dec 2009 | Online Presentations | Contributor(s): Ron Reifenberger

    http://nanohub.org/resources/7928

  7. ME 597 Lecture 17: Imaging or Peak Forces in Tapping Mode AFM

    01 Nov 2009 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/7720

  8. ME 597 Lecture 16: Analytical Descriptions of AM-AFM, Theory of Phase Contrast

    01 Nov 2009 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/7715

  9. ME 597 Lecture 13: Point Mass Models, Modeling AM-AFM

    01 Nov 2009 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/7708

  10. ME 597 Lecture 12: Introduction to Dynamic AFM – Point Mass Approximation

    01 Nov 2009 | Online Presentations | Contributor(s): Arvind Raman

    http://nanohub.org/resources/7703

  11. ME 597 Lecture 6: The Transition from STM to AFM

    26 Oct 2009 | Online Presentations | Contributor(s): Ron Reifenberger

    G. Binnig, C. Quate and Ch. Gerber, “Atomic Force Microscope”, Phys. Rev. Lett. 56, 930 (1986).

    http://nanohub.org/resources/7622

  12. VEDA: Amplitude Modulated Scanning

    20 Oct 2009 | Tools | Contributor(s): John Melcher, Shuiqing Hu, Arvind Raman, Steven Douglas Johnson, Daniel Kiracofe

    This tool is being replaced by VEDA 2.0. Use that tool instead.

    http://nanohub.org/resources/vedaams

  13. Katie M Smith

    http://nanohub.org/members/38245

  14. ME 597 Lecture 2: Electron States in Solids-Density of States

    09 Sep 2009 | Online Presentations | Contributor(s): Ron Reifenberger

    Note: This lecture has been revised since its original presentation. Topics: Electron States in Solids – Bloch Functions Kronig-Penney Model Density of States

    http://nanohub.org/resources/7343

  15. ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2009)

    03 Sep 2009 | Courses | Contributor(s): Ron Reifenberger, Arvind Raman

    A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

    http://nanohub.org/resources/7320

  16. ME 597 Lecture 1: Introduction to Basic Quantum Mechanics

    01 Sep 2009 | Online Presentations | Contributor(s): Ron Reifenberger

    Note: This lecture has been revised since its original presentation. Topics: Introduction to Basic Quantum Mechanics Energy States in Periodic Crystals Course is dual listed as...

    http://nanohub.org/resources/7321

  17. ME 597 Introductory Lecture

    01 Sep 2009 | Online Presentations | Contributor(s): Ron Reifenberger

    Course is dual listed as Physics 570.

    http://nanohub.org/resources/7322

  18. Nanotribology, Nanomechanics and Materials Characterization Studies

    08 Jun 2009 | Online Presentations | Contributor(s): Bharat Bhushan

    Fundamental nanotribological studies provide insight to molecular origins of interfacial phenomena including adhesion, friction, wear and lubrication. Friction and wear of lightly loaded...

    http://nanohub.org/resources/6573

  19. ECET 499N: Introduction to Nanotechnology

    30 Mar 2009 | Courses | Contributor(s): Helen McNally

    An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical...

    http://nanohub.org/resources/6583

  20. AFM imaging of bare silicon surface to measure its rms roughness

    Open | Responses: 1

    Dear Friends,

    my question is related to AFM imaging of silicon surface. after doing phase (AC mode) imaging of silicon surface. i found the roughness of bare silicon surface is ~ 50 nm....

    http://nanohub.org/answers/question/242