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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
Addressing Molecular Dynamics Time-scale Issues to Study Atomic-scale Friction
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12 Oct 2010 | Online Presentations | Contributor(s): Ashlie Martini
This presentation will include an introduction to several accelerated molecular dynamics methods. However, particular focus will be given to parallel replica (ParRep) dynamics in which atomistic …
AFM imaging of bare silicon surface to measure its rms roughness
Open | Responses: 1
Dear Friends, my question is related to AFM imaging of silicon surface. after doing phase (AC mode) imaging of silicon surface. i found the roughness of bare silicon surface is ~ 50 nm. while it …
AFM Metrology of Cellulose Nanocrystals
03 May 2011 | Online Presentations | Contributor(s): Robert J. Moon, Ryan Wagner
This talk discusses the characterization of cellulose nanocrystals via atomic force microscopy.
AFM Sample Preparation in Biology
03 May 2011 | Online Presentations | Contributor(s): Irene Revenko
All biological samples are different, the key is to start with established recipes for similar samples, then adapt the procedures for a different one. We'll present guidelines for choosing a …
Asylum Research Atomic Force Microscopy (AFM) Workshop
03 May 2011 | Workshops
This workshop includes lectures and equipment/imaging demonstrations for both life science applications and electrical characterization of materials.
Atomic Force Microscopy
01 Dec 2005 | Online Presentations | Contributor(s): Arvind Raman
Atomic Force Microscopy (AFM) is an indispensible tool in nano science for the fabrication, metrology, manipulation, and property characterization of nanostructures. This tutorial reviews some of the …
Atomic Force Microscopy: Applications for Life Science Research
21 Mar 2011 | Online Presentations | Contributor(s): Irene Revenko
This presentation presents the principles of AFM and demonstrates the applications in Life Sciences. We will also discuss key points about the technology, and more particularly, the technical …
Base Motion Calculations
17 Jun 2011 | Tools | Contributor(s): Daniel Kiracofe
Automates the calculations in the paper by Kiracofe and Raman, Nanotechnology, 2011
BME 695L Special Lecture 4: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)
02 Dec 2011 | Online Presentations | Contributor(s): Helen McNally
Guest lecturer: Helen McNally
BME 695N Lecture 9: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)
30 Sep 2007 | Online Presentations | Contributor(s): Helen McNally
What Helen McNally as guest lecturer.
BNC Annual Research Symposium: Metrology and Nanomaterials Characterization
10 May 2007 | Online Presentations | Contributor(s): Ron Reifenberger
This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming …
BNC Research Review: Carbon Nanotubes as Nucleic Acid Carriers
04 Jun 2008 | Online Presentations | Contributor(s): Don Bergstrom
Determining the Mechanics of Living Cells by Atomic Force Microscopy
21 Apr 2004 | Notes | Contributor(s): Emilie Grzywa Rexeisen
2003 SURI Conference Proceedings
ECET 499N Lecture 12: Scanning Probe Microscopy Applications (in Neuroscience and Beyond)
12 Apr 2010 | Online Presentations | Contributor(s): Helen McNally
ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | Courses | Contributor(s): Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical …
Electronic Characterization of Materials Using Conductive AFM
21 Mar 2011 | Online Presentations | Contributor(s): Amir Moshar
Purdue University Discovery Park, Asylum Research
Force Measurements in AFM
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