Tags: atomic force microscopy (AFM)

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Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

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  1. Tejasvi Parupudi S V R V

    Graduate Student working on AFM. Interested in BioMEMS, medical devices.

    https://nanohub.org/members/57433

  2. Tewfik Souier

    https://nanohub.org/members/73657

  3. Texture-Induced hcp c-axis Alignment in Longitudinal Media

    15 Jul 2013 | Contributor(s):: Brian Demczyk

    This presentation discusses the development and measurement of c-axis text in longitudinal hard disk media.

  4. The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale

    20 Jul 2018 | | Contributor(s):: Stephen J. Fonash, NACK Network

    OutlineThe tools for characterizing materials and structures at the nano-scaleProbesPhoton beamsElectron beamsIon beamsAcoustic waves

  5. Tianmao Lai

    https://nanohub.org/members/109578

  6. TiCN/TiNbCN Multilayer System with Enhanced Tribological Properties

    20 Oct 2010 | | Contributor(s):: Pedro Antonio Prieto

    Improvement in the mechanical properties of hard coatings such monolayer (TiN, CrN, AlCN, WC-Co, TiCN) [1], has been achieved using compositional gradient WC/C layer, or multilayered type [transition metal/transition carbide]n, [transition metal/transition nitride]n, [TiCN/ZrCN]n, among others....

  7. Toward Improving the Precision of Nanoscale Force-Displacement Measurements

    out of 5 stars 

    13 Mar 2007 | | Contributor(s):: Jason Clark

    Nanotechnology has great potential for being used to create better medicines, materials, and sensors. With increasing interest in nanotechnology to improve the quality of our lives, there has been an increasing use of nanoscience tools to measure force and displacement to understand nanoscale...

  8. Uzair Iqbal

    Currently, I am a PhD Student in Department of Mechanical Engineering, IISc, Bangalore. I completed my B.Tech in Mechanical Engineering from NIT-Trichy in 2019. I had my schooling done in Aligarh...

    https://nanohub.org/members/295023

  9. VEDA 2.0 (Virtual Environment for Dynamic AFM)

    out of 5 stars 

    28 Aug 2008 | | Contributor(s):: John Melcher, Daniel Kiracofe, Shuiqing Hu, Arvind Raman

    There is a new version of this tool which can be found here. Please use that tool instead

  10. VEDA First-time User Manual

    out of 5 stars 

    07 Aug 2012 | | Contributor(s):: John Melcher, Daniel Kiracofe, Shuiqing Hu, Steven Douglas Johnson, Sudharsan Balasubramaniam, Arvind Raman

    This document is intended to be a “quickstart” guide to get new users running their first simulations with VEDA, walking the user through two easy examples. After completing these simple examples, the user is referred to the comprehensive manual for a more detailed description and additional...

  11. VEDA Manual

    out of 5 stars 

    07 Aug 2012 | | Contributor(s):: John Melcher, Daniel Kiracofe, Shuiqing Hu, Steven Douglas Johnson, Sudharsan Balasubramaniam, Arvind Raman

    This is a comprehensive manual for the VEDA (VIRTUAL ENVIRONMENT FOR DYNAMIC AFM) Version 2.0 simulation tool.

  12. VEDA: Amplitude Modulated Scanning

    out of 5 stars 

    20 Oct 2009 | | Contributor(s):: John Melcher, Shuiqing Hu, Arvind Raman, Steven Douglas Johnson, Daniel Kiracofe

    This tool is being replaced by VEDA 2.0. Use that tool instead.

  13. VEDA: Dynamic Approach Curves

    out of 5 stars 

    15 Mar 2007 | | Contributor(s):: John Melcher, Shuiqing Hu, Steven Douglas Johnson, Daniel Kiracofe, Arvind Raman

    This tool is being replaced by VEDA 2.0. Use that tool instead.

  14. VEDA: Virtual Environment for Dynamic AFM

    out of 5 stars 

    30 May 2012 | | Contributor(s):: Daniel Kiracofe, John Melcher, Arvind Raman, Sudharsan Balasubramaniam, Steven Douglas Johnson, Shuiqing Hu

    A suite of dynamic AFM simulators for air/liquid/vacuum on soft or hard samples.

  15. Vsevolod Kosulnikov

    https://nanohub.org/members/56242

  16. Apr 01 2015

    Workshop on Nanoindentation and Its Applications in Mechanotransduction and Characterization of Soft Materials

    Characterizing the mechanical properties of materials using indentation has been around for centuries. It was only recently that it emerged as a technique of choice for characterizing soft and...

    https://nanohub.org/events/details/1125

  17. [Illinois] AFM indentation tests reveal the poroelastic nature of the cytoplasm

    out of 5 stars 

    19 Nov 2015 | | Contributor(s):: Emad Moeendarbary

  18. [Illinois] AMC 2016 workshop: In-situ and real time study of SEI formation on anode in a Lithium battery cell using atomic force microscope

    out of 5 stars 

    09 Jun 2016 | | Contributor(s):: Song Xu

    Advanced Material Characterization Workshop June 7-8 2016 Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign  

  19. [Illinois] AMC 2016 workshop: Quantitative AM-FM mode for fast and versatile imaging of nanoscale elastic modulus

    out of 5 stars 

    09 Jun 2016 | | Contributor(s):: Marta Kocun

    Advanced Material Characterization Workshop June 7-8 2016 Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign  

  20. [Illinois] GEM4 2012: 3D Microscopy, Confocal, Multiphoton & SHG Microscopy

    out of 5 stars 

    29 Dec 2012 | | Contributor(s):: Peter So

    Our objective is to educate researchers and graduate students about the fundamentals of cell and molecular biomechanics, and to provide an intense learning experience, and to facilitate interactions among engineers, biologists and clinicians. The goals are to help train a new generation of...