Tags: atomic force microscopy (AFM)

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Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

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  1. BNC Annual Research Symposium: Metrology and Nanomaterials Characterization

    out of 5 stars 

    10 May 2007 | | Contributor(s):: Ron Reifenberger

    This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.

  2. BNC Research Review: Carbon Nanotubes as Nucleic Acid Carriers

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    04 Jun 2008 | | Contributor(s):: Don Bergstrom

    This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.

  3. Bogdan Mihai Neamtu

    https://www.linkedin.com/profile/view?id=AAIAAApgIH8BjDdkIuCzTZsuJkYAtcSLwNBoBRA&trk=nav_responsive_tab_profile

    https://nanohub.org/members/134289

  4. Brad Weedon

    https://nanohub.org/members/69741

  5. Bryan Auxier

    https://nanohub.org/members/215608

  6. Butterfly Wing at the Nanoscale

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    09 Mar 2022 | | Contributor(s):: NACK Network

    Eliza demonstrates various microscopes and the abilities each offers a user in examining a butterfly wing. Facts about each microscope, and butterflies in general, are offered in an interactive experience designed to engage students of all ages.

  7. Carbon Nanotube Counter

    08 Aug 2018 | | Contributor(s):: Quinn Lennemann

    Carbon Nanotube Counter (CNT Counter) is a program that can count the density of Carbon Nanotubes in microscope scans. The program supports JPEG and TIFF images from both Scanning Electron Microscopes (SEMs) and Atomic Force Microscopes (AFMs). This program contains both an automatic mode and a...

  8. CDs and DVDs as Diffraction Gratings

    13 Jan 2020 | | Contributor(s):: Rama Balachandran, Karen Porter Davis, NNCI Nano

    The objective of this lab is to compare the diffraction behavior of light waves between a CD and DVD. CDs and DVDs contain regularly spaced micrometer sized features which can act like a diffraction grating. Using commercial electronic storage devices like CDs and DVDs as gratings rather than...

  9. Characterization - Atomic Force Microscopy

    12 Jan 2022 | | Contributor(s):: Wesley C. Sanders, NACK Network

  10. Determining the Mechanics of Living Cells by Atomic Force Microscopy

    out of 5 stars 

    21 Apr 2004 | | Contributor(s):: Emilie Grzywa Rexeisen

    2003 SURI Conference Proceedings

  11. Dr. Heinz Sturm

    https://nanohub.org/members/32408

  12. ECET 499N Lecture 12: Scanning Probe Microscopy Applications (in Neuroscience and Beyond)

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    12 Apr 2010 | | Contributor(s):: Helen McNally

  13. ECET 499N: Introduction to Nanotechnology

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    30 Mar 2009 | | Contributor(s):: Helen McNally

    An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...

  14. Electronic Characterization of Materials Using Conductive AFM

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    21 Mar 2011 | | Contributor(s):: Amir Moshar

  15. Fabrication and Characterization of Nanostructures Using AFM

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    25 Feb 2022 | | Contributor(s):: Wesley C. Sanders, Glen Johnson, NACK Network

    The atomic force microscope (AFM) is a versatile characterization tool that allows users to acquire high-resolution images of nanoscale surface features. In addition to probing nanoscale surface topography, AFMs can be used to print nanoscale structures using additive and subtractive lithographic...

  16. Filippo Mangolini

    https://nanohub.org/members/71694

  17. Force Measurements in AFM

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    21 Mar 2011 | | Contributor(s):: Amir Moshar

  18. Frederic Sansoz

    https://nanohub.org/members/52609

  19. Frontiers in Scanning Probe Microscopy

    out of 5 stars 

    30 Nov 2006 |

    From October 4- 6, 2006 the Birck Nanotechnology Center at Purdue University hosted a three day focused workshop on cutting edge SPM techniques that are under development throughout the world.The three day workshop featured thematically arranged invited talks. The workshop themes are...

  20. Fundamentals of Metrology and Characterization for Nanotechnology

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    12 Mar 2019 | | Contributor(s):: Diane Hickey-Davis, NACK Network

    Outline:How do we see what we can’t see?Five common nanotech instrumentsFor each, I’ll cover:What it doesHow it worksWhere it’s used in IndustryWhat subjects you can teach with itWhat skills your students can learn from it