Tags: atomic force microscopy (AFM)

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

All Categories (1-20 of 156)

  1. Paven Thomas Mathew

    http://nanohub.org/members/264875

  2. 3 min Research Talk: AFM And EBSD Cross-Comparison Analysis Tool

    31 Jan 2019 | | Contributor(s):: Andrew Martin Krawec

    This talk describes an approach to analyzing the crystal structure using data collected from AFM and EBSD scans to build an accurate image of the crystal structure and orientation in the ceramic

  3. Bryan Auxier

    http://nanohub.org/members/215608

  4. Marcus Böhm

    http://nanohub.org/members/209984

  5. AFM And EBSD Cross-Comparison Analysis Tool

    14 Aug 2018 | | Contributor(s):: Andrew Martin Krawec, John Blendell, Matthew John Michie

    Ceramic and semiconductor research is limited in its ability to create holistic representations of data in concise, easily-accessible file formats or visual data representations. These materials are used in everyday electronics, and optimizing their electrical and physical properties is...

  6. Carbon Nanotube Counter

    08 Aug 2018 | | Contributor(s):: Quinn Lennemann

    Carbon Nanotube Counter (CNT Counter) is a program that can count the density of Carbon Nanotubes in microscope scans. The program supports JPEG and TIFF images from both Scanning Electron Microscopes (SEMs) and Atomic Force Microscopes (AFMs). This program contains both an automatic mode and a...

  7. Himanshu Patel

    http://nanohub.org/members/198194

  8. Learning Module: Microcantilevers - Instructor Materials

    09 Feb 2017 | | Contributor(s):: Southwest Center for Microsystems Education (SCME)

    ­This learning module is an overview of microcantilevers, how they work and how they are used in micro and nanotechnology.  These are the instructor materials.

  9. Learning Module: Microcantilevers

    09 Feb 2017 | | Contributor(s):: Southwest Center for Microsystems Education (SCME)

    This learning module introduces you to the microcantilever, its applications in micro and nanotechnologies, its use in sensor arrays, and how it works in both static and dynamic modes of operation.  There is a pre and post-test, four (4) informational units (PKs), and two (2)...

  10. High Accuracy Atomic Force Microscope with Self-Optimizing Scan Control

    19 Sep 2016 | | Contributor(s):: Ryan (Young-kook) Yoo

    Atomic force microscope (AFM) is a very useful instrument in characterizing nanoscale features, However, the original AFM design, based on piezo-tube scanner, had slow response and non-orthogonal behavior, inadequate to address the metrology needs of industrial applications: accuracy,...

  11. Jul 25 2016

    International Conference on Non-Contact Atomic Force Microscopy

    NC-AFM 2016 will be held at the East Midlands Conference Centre at the University of Nottingham and is the 19th conference in the International Non-contact Atomic Force Microscopy (NC-AFM)...

    http://nanohub.org/events/details/1466

  12. Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode

    19 May 2016 | Posted by Rostislav Vladimirovich Lapshin

    R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode, Applied Surface Science, vol. 378, pp. 530-539, 2016 (DOI:...

    http://nanohub.org/members/112015/blog/2016/05/research-article-drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in

  13. Jhon Pazos Alonso

    http://nanohub.org/members/145014

  14. Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description

    04 Dec 2015 | Posted by Rostislav Vladimirovich Lapshin

    R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description, Applied Surface Science, vol. 359, pp. 629-636, 2015 (DOI:...

    http://nanohub.org/members/112015/blog/2015/12/drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in-nanometer-range-approach

  15. [Illinois] AFM indentation tests reveal the poroelastic nature of the cytoplasm

    19 Nov 2015 | | Contributor(s):: Emad Moeendarbary

  16. Bogdan Mihai Neamtu

    https://www.linkedin.com/profile/view?id=AAIAAApgIH8BjDdkIuCzTZsuJkYAtcSLwNBoBRA&trk=nav_responsive_tab_profile

    http://nanohub.org/members/134289

  17. Heon-Yul Ryu

    http://nanohub.org/members/134189

  18. Apr 01 2015

    Workshop on Nanoindentation and Its Applications in Mechanotransduction and Characterization of Soft Materials

    Characterizing the mechanical properties of materials using indentation has been around for centuries. It was only recently that it emerged as a technique of choice for characterizing soft and...

    http://nanohub.org/events/details/1125

  19. Kathy Walsh

    http://nanohub.org/members/119508

  20. Structure and Morphology of Silicon-Germanium Thin Films

    07 Feb 2015 | | Contributor(s):: Brian Demczyk

    This presentation describes the growth of (Si,Ge & SiGe) thin films on Si and Ge (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition (UHVCVD). Thin films were characterized structurally by conventional and high-resolution transmission electron microscopy (TEM) and...