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Schred: Exercise 3
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06 Jul 2008 | | Contributor(s):: Dragica Vasileska, Gerhard Klimeck
This exercise examines the degradation of the total gate capacitance with technology generation due to Maxwell-Boltzmann instead of Fermi-Dirac statistics, quantum-mechanical charge description and depletion of the polysilicon gates. www.eas.asu.edu/~vasilesk NSF