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Tags: characterization

Online Presentations (1-2 of 2) feed

  1. Electronic Characterization of Materials Using Conductive AFM

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    Total: updated 01 Dec, 2011
    Users: 33
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    03 May 2011 | Online Presentations | Contributor(s): Amir Moshar

    Purdue University Discovery Park, Asylum Research

    http://nanohub.org/resources/11020

  2. X-ray Diffraction and Reflectivity Analysis of Thin Films and Nanomaterials

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    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 444
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    Avg. Review: 4.0 out of 5 stars
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    29 Dec 2009 | Online Presentations | Contributor(s): Mauro Sardela

    A review of x-ray analysis techniques applied to the characterization of nanomaterials will be presented with focus on x-ray lab source instrumentation similar to the facilities available at the …

    http://nanohub.org/resources/7955

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