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Characterization of 2D materials at Birck Surface Analysis Facility
28 Sep 2016 | Online Presentations | Contributor(s): Dmitry Zemlyanov
Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material...
[Illinois] AMC 2016 workshop: An introduction to elemental analysis by ED-XRF and an overview of its applications to materials characterization laboratories
13 Jun 2016 | Online Presentations | Contributor(s): Justin Masone
Advanced Material Characterization Workshop June 7-8 2016 Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign
New Frontiers in Terahertz Technology
13 May 2015 | Online Presentations | Contributor(s): Mona Jarrahi
In this talk, I will describe some of our recent results on developing fundamentally new terahertz electronic/optoelectronic components and imaging/spectrometry architectures to mitigate...
[Illinois] Modeling and Characterization of Anisotropic Objects by Volume Integral Equation Methods
10 Mar 2015 | Online Presentations | Contributor(s): Lin Sun
Lin Sun received her B.S. and M.S. degrees in Electrical Engineering from Tsinghua University, Beijing, China, in 2001 and 2004 and Ph.D. degree in Electrical and Computer Engineering from the...
20 Jan 2015 | Online Presentations | Contributor(s): Lin Sun
[Illinois] Got Milk?: Characterization, Synthesis and Utilization of Human Milk Oligosaccharides
04 Feb 2014 | Online Presentations | Contributor(s): Michael Miller
April 18, 2013. BioEngineering Seminar Series. University of Illinois Urbana-Champaign
"Got Milk?: Characterization, Synthesis and Utilization of Human Milk Oligosaccharides"
Dr. Michael Miller,...
Application of Dynamic Light Scattering in the Physicochemical Characterization of Natural and Engineered Nanoparticles
20 Apr 2012 | Online Presentations | Contributor(s): Trisha Eustaquio
This presentation will highlight the use of dynamic light scattering (DLS), which measures the hydrodynamic size of nanoparticles in suspension, in characterizing specific examples of engineered...
Electronic Characterization of Materials Using Conductive AFM
03 May 2011 | Online Presentations | Contributor(s): Amir Moshar
Purdue University Discovery Park,
X-ray Diffraction and Reflectivity Analysis of Thin Films and Nanomaterials
29 Dec 2009 | Online Presentations | Contributor(s): Mauro Sardela
A review of x-ray analysis techniques applied to the characterization of nanomaterials will be presented with focus on x-ray lab source instrumentation similar to the facilities available at the...