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Characterization of 2D materials at Birck Surface Analysis Facility
28 Sep 2016 | | Contributor(s):: Dmitry Zemlyanov
Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center,...
[Illinois] AMC 2016 workshop: An introduction to elemental analysis by ED-XRF and an overview of its applications to materials characterization laboratories
13 Jun 2016 | | Contributor(s):: Justin Masone
Advanced Material Characterization Workshop June 7-8 2016 Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign
New Frontiers in Terahertz Technology
13 May 2015 | | Contributor(s):: Mona Jarrahi
In this talk, I will describe some of our recent results on developing fundamentally new terahertz electronic/optoelectronic components and imaging/spectrometry architectures to mitigate performance limitations of existing terahertz systems.
[Illinois] Modeling and Characterization of Anisotropic Objects by Volume Integral Equation Methods
10 Mar 2015 | | Contributor(s):: Lin Sun
20 Jan 2015 | | Contributor(s):: Lin Sun
[Illinois] Got Milk?: Characterization, Synthesis and Utilization of Human Milk Oligosaccharides
04 Feb 2014 | | Contributor(s):: Michael Miller
Application of Dynamic Light Scattering in the Physicochemical Characterization of Natural and Engineered Nanoparticles
20 Apr 2012 | | Contributor(s):: Trisha Eustaquio
This presentation will highlight the use of dynamic light scattering (DLS), which measures the hydrodynamic size of nanoparticles in suspension, in characterizing specific examples of engineered and natural nanoparticles. In terms of engineered nanoparticles, the role of nanoparticle size in...
Electronic Characterization of Materials Using Conductive AFM
03 May 2011 | | Contributor(s):: Amir Moshar
X-ray Diffraction and Reflectivity Analysis of Thin Films and Nanomaterials
29 Dec 2009 | | Contributor(s):: Mauro Sardela
A review of x-ray analysis techniques applied to the characterization of nanomaterials will be presented with focus on x-ray lab source instrumentation similar to the facilities available at the Birck Nanotechnology Center. Practical aspects of data acquisition and interpretation using x-ray...