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Application of Dynamic Light Scattering in the Physicochemical Characterization of Natural and Engineered Nanoparticles
20 Apr 2012 | Online Presentations | Contributor(s): Trisha Eustaquio
This presentation will highlight the use of dynamic light scattering (DLS), which measures the hydrodynamic size of nanoparticles in suspension, in characterizing specific examples of engineered...
Carbon Nanotubes Interconnect Analyzer (CNIA)
5.0 out of 5 stars
14 Mar 2007 | Tools | Contributor(s): Sansiri Tanachutiwat, Wei Wang
Analyze performances of carbon nanotube bundle interconnects
Electronic Characterization of Materials Using Conductive AFM
03 May 2011 | Online Presentations | Contributor(s): Amir Moshar
Purdue University Discovery Park,
0.0 out of 5 stars
13 Jun 2008 | Tools | Contributor(s): Sansiri Tanachutiwat, Wei Wang, Nicholas Anthony Connelly
Estimate performances of graphene interconnects
Jul 08 2013
Interdisciplinary Symposium on Advanced Nano/Biosystems: Design, Fabrication, and Characterization
Introduction to Reliability
Generalized Reliability Model
A Blind Fish in a River with a Waterfall
Many reliability problems are activated by a threshold. If this threshold value is exceeded, some phenomenons are...
John Jay Young
Malvern Instruments Workshop: Nano-particle Characterization Symposium
11 Apr 2012 | Workshops | Contributor(s): James Leary
The key focus of the symposium is to demonstrate how different analytical techniques provide the information needed to advance nanotechnology.
Monica Marie Cortez Allain
09 Feb 2007 | Tools | Contributor(s): Wei Zhao, Yu Cao
Predictive model files for future transistor technologies.
06 Mar 2015 | Data Exploration | Contributor(s): NanomaterialRegistry
View, visualize and download data using IDENT, the Interactive Data Exploration and Navigation Tool.
Nov 17 2009
Nanomaterials and Human Health & Instrumentation, Metrology, and Analytical Methods
PETE : Purdue Emerging Technology Evaluator
27 Jun 2007 | Tools | Contributor(s): Arijit Raychowdhury, Charles Augustine, Yunfei Gao, Mark Lundstrom, Kaushik Roy
Estimate circuit level performance and power of novel devices
Standard Practice for Workforce Education in Nanotechnology Characterization
12 May 2015 |
Posted by Tanya Faltens
Theory and characterization of random defect formation and its implication in variability of nanoscale transistors
30 Sep 2011 | Papers | Contributor(s): Ahmad Ehteshamul Islam
Over the last 50 years, carrier transport has been the central research topic in the semiconductor area. The outcome was a dramatic improvement in the performance of a transistor, which is one of...
X-ray Diffraction and Reflectivity Analysis of Thin Films and Nanomaterials
29 Dec 2009 | Online Presentations | Contributor(s): Mauro Sardela
A review of x-ray analysis techniques applied to the characterization of nanomaterials will be presented with focus on x-ray lab source instrumentation similar to the facilities available at the...